69.9LGMay 5
LLM-ADAM: A Generalizable LLM Agent Framework for Pre-Print Anomaly Detection in Additive ManufacturingAhmadreza Eslaminia, Chuhan Cai, Cameron Smith et al.
Additive manufacturing (AM) continues to transform modern manufacturing by enabling flexible, on-demand production of complex geometries across diverse industries. Fused filament fabrication (FFF) has extended AM to laboratories, classrooms, and small production environments, but this accessibility shifts process-planning responsibility to users who may lack manufacturing expertise. A syntactically valid slicer profile can still encode thermally or geometrically harmful settings, and subtle G-code edits can alter extrusion, cooling, or adhesion before a print begins. Pre-print G-code screening catches accidental or adversarial machine-program errors before material or machine time is wasted. This paper proposes LLM-ADAM as a generalizable LLM framework for pre-print anomaly detection in AM. The framework decomposes the task into three roles: Extractor-LLM maps a G-code file to a structured process-parameter schema; Reference-LLM converts printer and material documentation into aligned operating ranges; and Judge-LLM interprets a deterministic deviation table and G-code evidence to decide whether a part is non-defective or belongs to an anomaly class. Printers, materials, and LLM backbones are interchangeable test conditions, not fixed assumptions. We evaluate the framework on an N=200 FFF G-code corpus spanning two desktop printer families, two materials, and five classes including non-defective, under-extrusion, over-extrusion, warping, and stringing. The best framework configuration reaches 87.5% accuracy, compared with 59.5% for the strongest engineered single-LLM baseline. The results show that structured decomposition, rather than backbone strength alone, is the dominant source of improvement, with defect classes identified at or near ceiling for leading configurations while residual errors concentrate on conservative false alarms for non-defective samples.
CVJan 13
Adaptive few-shot learning for robust part quality classification in two-photon lithographySixian Jia, Ruo-Syuan Mei, Chenhui Shao
Two-photon lithography (TPL) is an advanced additive manufacturing (AM) technique for fabricating high-precision micro-structures. While computer vision (CV) is proofed for automated quality control, existing models are often static, rendering them ineffective in dynamic manufacturing environments. These models typically cannot detect new, unseen defect classes, be efficiently updated from scarce data, or adapt to new part geometries. To address this gap, this paper presents an adaptive CV framework for the entire life-cycle of quality model maintenance. The proposed framework is built upon a same, scale-robust backbone model and integrates three key methodologies: (1) a statistical hypothesis testing framework based on Linear Discriminant Analysis (LDA) for novelty detection, (2) a two-stage, rehearsal-based strategy for few-shot incremental learning, and (3) a few-shot Domain-Adversarial Neural Network (DANN) for few-shot domain adaptation. The framework was evaluated on a TPL dataset featuring hemisphere as source domain and cube as target domain structures, with each domain categorized into good, minor damaged, and damaged quality classes. The hypothesis testing method successfully identified new class batches with 99-100% accuracy. The incremental learning method integrated a new class to 92% accuracy using only K=20 samples. The domain adaptation model bridged the severe domain gap, achieving 96.19% accuracy on the target domain using only K=5 shots. These results demonstrate a robust and data-efficient solution for deploying and maintaining CV models in evolving production scenarios.
CVNov 28, 2025
Hybrid Synthetic Data Generation with Domain Randomization Enables Zero-Shot Vision-Based Part Inspection Under Extreme Class ImbalanceRuo-Syuan Mei, Sixian Jia, Guangze Li et al.
Machine learning, particularly deep learning, is transforming industrial quality inspection. Yet, training robust machine learning models typically requires large volumes of high-quality labeled data, which are expensive, time-consuming, and labor-intensive to obtain in manufacturing. Moreover, defective samples are intrinsically rare, leading to severe class imbalance that degrades model performance. These data constraints hinder the widespread adoption of machine learning-based quality inspection methods in real production environments. Synthetic data generation (SDG) offers a promising solution by enabling the creation of large, balanced, and fully annotated datasets in an efficient, cost-effective, and scalable manner. This paper presents a hybrid SDG framework that integrates simulation-based rendering, domain randomization, and real background compositing to enable zero-shot learning for computer vision-based industrial part inspection without manual annotation. The SDG pipeline generates 12,960 labeled images in one hour by varying part geometry, lighting, and surface properties, and then compositing synthetic parts onto real image backgrounds. A two-stage architecture utilizing a YOLOv8n backbone for object detection and MobileNetV3-small for quality classification is trained exclusively on synthetic data and evaluated on 300 real industrial parts. The proposed approach achieves an mAP@0.5 of 0.995 for detection, 96% classification accuracy, and 90.1% balanced accuracy. Comparative evaluation against few-shot real-data baseline approaches demonstrates significant improvement. The proposed SDG-based approach achieves 90-91% balanced accuracy under severe class imbalance, while the baselines reach only 50% accuracy. These results demonstrate that the proposed method enables annotation-free, scalable, and robust quality inspection for real-world manufacturing applications.