Ali Amini

AI
h-index28
3papers
1citation
Novelty40%
AI Score37

3 Papers

6.4CVMay 23
From Full Boards to Tiny Defects: Scale-Aware Tile Inference with Topology-Aware Merging for High-Resolution PCB Defect Detection

Mohammad Alijanpour Shalmani, Alale Rezvani Boroujeni, Ali Amini et al.

High-resolution printed circuit board (PCB) inspection suffers from resolution collapse when full-board images are resized to standard detector inputs: micro-scale defects shrink to a few pixels and are missed. Tile-based inference preserves local detail but introduces boundary artefacts at tile edges, causing split detections and false negatives. We present a systematic comparison of five inference strategies evaluated on two high-resolution PCB defect datasets, PCB-Defect (230 images, 1704 annotations) and HRIPCB (693 images, 2 953 annotations), spanning six defect classes. We show that training-inference scale consistency is critical: a detector trained on full images collapses to mAP@50 = 0.01 under tile inference, while the same architecture trained on 640*640 tile crops achieves 0.72 and 0.94 on the two datasets respectively. We further exploited Topology-Aware Tile Merging (TA-TM), a training-free post-processing method that builds a tile-adjacency graph and adjusts boundary-sensitive detection scores using neighbour-tile agreement before global NMS. Across both datasets, adding 128 px tile overlap raises boundary-zone recall from ~26-63% to ~70-100%, TA-TM achieves the best mAP@50 on both benchmarks, and tile inference recovers 46-100% of small defects missed entirely by full-image methods. Results are consistent across datasets, confirming the generalizability of the proposed strategy. TA-TM requires no retraining and is architecture-agnostic, making it directly applicable to existing PCB inspection pipelines.

LGSep 10, 2025
ADHDeepNet From Raw EEG to Diagnosis: Improving ADHD Diagnosis through Temporal-Spatial Processing, Adaptive Attention Mechanisms, and Explainability in Raw EEG Signals

Ali Amini, Mohammad Alijanpour, Behnam Latifi et al.

Attention Deficit Hyperactivity Disorder (ADHD) is a common brain disorder in children that can persist into adulthood, affecting social, academic, and career life. Early diagnosis is crucial for managing these impacts on patients and the healthcare system but is often labor-intensive and time-consuming. This paper presents a novel method to improve ADHD diagnosis precision and timeliness by leveraging Deep Learning (DL) approaches and electroencephalogram (EEG) signals. We introduce ADHDeepNet, a DL model that utilizes comprehensive temporal-spatial characterization, attention modules, and explainability techniques optimized for EEG signals. ADHDeepNet integrates feature extraction and refinement processes to enhance ADHD diagnosis. The model was trained and validated on a dataset of 121 participants (61 ADHD, 60 Healthy Controls), employing nested cross-validation for robust performance. The proposed two-stage methodology uses a 10-fold cross-subject validation strategy. Initially, each iteration optimizes the model's hyper-parameters with inner 2-fold cross-validation. Then, Additive Gaussian Noise (AGN) with various standard deviations and magnification levels is applied for data augmentation. ADHDeepNet achieved 100% sensitivity and 99.17% accuracy in classifying ADHD/HC subjects. To clarify model explainability and identify key brain regions and frequency bands for ADHD diagnosis, we analyzed the learned weights and activation patterns of the model's primary layers. Additionally, t-distributed Stochastic Neighbor Embedding (t-SNE) visualized high-dimensional data, aiding in interpreting the model's decisions. This study highlights the potential of DL and EEG in enhancing ADHD diagnosis accuracy and efficiency.

AIJan 11, 2025
Survey Transfer Learning: Recycling Data with Silicon Responses

Ali Amini

As researchers increasingly turn to large language models (LLMs) to generate synthetic survey data, less attention has been paid to alternative AI paradigms given environmental costs of LLMs. This paper introduces Survey Transfer Learning (STL), which develops transfer learning paradigms from computer science for survey research to recycle existing survey data and generate empirically grounded silicon responses. Inspired by political behavior theory, STL leverages shared demographic variables with high predictive power in a polarized American context to transfer knowledge across surveys. Using a neural network pre-trained on the Cooperative Election Study (CES) 2020, freezing early layers to preserve learned structure, and fine-tuning top layers on the American National Election Studies (ANES) 2020, STL generates silicon responses CES 2022 and in held-out ANES 2020 data with accuracy rates of up to 93 percent. Results show that STL outperforms LLMs, especially on sensitive measures such as racial resentment. While LLMs silicon samples are costly and opaque, STL generates empirically grounded silicon responses with high individual-level accuracy, potentially helping to mitigate key challenges in social science and the polling industry.