K. Joost Batenburg

Jiayang Shi, Junyi Zhu, Daniel M. Pelt et al.

Computed Tomography (CT) is pivotal in industrial quality control and medical diagnostics. Sparse-view CT, offering reduced ionizing radiation, faces challenges due to its under-sampled nature, leading to ill-posed reconstruction problems. Recent advancements in Implicit Neural Representations (INRs) have shown promise in addressing sparse-view CT reconstruction. Recognizing that CT often involves scanning similar subjects, we propose a novel approach to improve reconstruction quality through joint reconstruction of multiple objects using INRs. This approach can potentially utilize the advantages of INRs and the common patterns observed across different objects. While current INR joint reconstruction techniques primarily focus on speeding up the learning process, they are not specifically tailored to enhance the final reconstruction quality. To address this gap, we introduce a novel INR-based Bayesian framework integrating latent variables to capture the common patterns across multiple objects under joint reconstruction. The common patterns then assist in the reconstruction of each object via latent variables, thereby improving the individual reconstruction. Extensive experiments demonstrate that our method achieves higher reconstruction quality with sparse views and remains robust to noise in the measurements as indicated by common numerical metrics. The obtained latent variables can also serve as network initialization for the new object and speed up the learning process.

Vladyslav Andriiashen, Robert van Liere, Tristan van Leeuwen et al.

Background: X-ray imaging is widely used for the non-destructive detection of defects in industrial products on a conveyor belt. In-line detection requires highly accurate, robust, and fast algorithms. Deep Convolutional Neural Networks (DCNNs) satisfy these requirements when a large amount of labeled data is available. To overcome the challenge of collecting these data, different methods of X-ray image generation are considered. Objective: Depending on the desired degree of similarity to real data, different physical effects should either be simulated or can be ignored. X-ray scattering is known to be computationally expensive to simulate, and this effect can greatly affect the accuracy of a generated X-ray image. We aim to quantitatively evaluate the effect of scattering on defect detection. Methods: Monte-Carlo simulation is used to generate X-ray scattering distribution. DCNNs are trained on the data with and without scattering and applied to the same test datasets. Probability of Detection (POD) curves are computed to compare their performance, characterized by the size of the smallest detectable defect. Results: We apply the methodology to a model problem of defect detection in cylinders. When trained on data without scattering, DCNNs reliably detect defects larger than 1.3 mm, and using data with scattering improves performance by less than 5%. If the analysis is performed on the cases with large scattering-to-primary ratio ($1 < SPR < 5$), the difference in performance could reach 15% (approx. 0.4 mm). Conclusion: Excluding the scattering signal from the training data has the largest effect on the smallest detectable defects, and the difference decreases for larger defects. The scattering-to-primary ratio has a significant effect on detection performance and the required accuracy of data generation.