CVOct 27, 2023Code
Siamese-DETR for Generic Multi-Object TrackingQiankun Liu, Yichen Li, Yuqi Jiang et al.
The ability to detect and track the dynamic objects in different scenes is fundamental to real-world applications, e.g., autonomous driving and robot navigation. However, traditional Multi-Object Tracking (MOT) is limited to tracking objects belonging to the pre-defined closed-set categories. Recently, Open-Vocabulary MOT (OVMOT) and Generic MOT (GMOT) are proposed to track interested objects beyond pre-defined categories with the given text prompt and template image. However, the expensive well pre-trained (vision-)language model and fine-grained category annotations are required to train OVMOT models. In this paper, we focus on GMOT and propose a simple but effective method, Siamese-DETR, for GMOT. Only the commonly used detection datasets (e.g., COCO) are required for training. Different from existing GMOT methods, which train a Single Object Tracking (SOT) based detector to detect interested objects and then apply a data association based MOT tracker to get the trajectories, we leverage the inherent object queries in DETR variants. Specifically: 1) The multi-scale object queries are designed based on the given template image, which are effective for detecting different scales of objects with the same category as the template image; 2) A dynamic matching training strategy is introduced to train Siamese-DETR on commonly used detection datasets, which takes full advantage of provided annotations; 3) The online tracking pipeline is simplified through a tracking-by-query manner by incorporating the tracked boxes in previous frame as additional query boxes. The complex data association is replaced with the much simpler Non-Maximum Suppression (NMS). Extensive experimental results show that Siamese-DETR surpasses existing MOT methods on GMOT-40 dataset by a large margin. Codes are avaliable at \url{https://github.com/yumu-173/Siamese-DETR}.
CVJul 15, 2024
FabGPT: An Efficient Large Multimodal Model for Complex Wafer Defect Knowledge QueriesYuqi Jiang, Xudong Lu, Qian Jin et al.
Intelligence is key to advancing integrated circuit (IC) fabrication. Recent breakthroughs in Large Multimodal Models (LMMs) have unlocked extraditionary abilities in understanding images and text, fostering intelligent fabrication. Leveraging the power of LMMs, we introduce FabGPT, a customized IC fabrication large multimodal model for wafer defect knowledge query. FabGPT manifests expertise in conducting defect detection in Scanning Electron Microscope (SEM) images, performing root cause analysis, and providing expert Q&A on fabrication processes. FabGPT matches enhanced multimodal features to automatically detect minute defects under complex wafer backgrounds and reduce the subjectivity of manual threshold settings. Besides, the proposed modulation module and interactive corpus training strategy embed wafer defect knowledge into the pre-trained model, effectively balancing Q&A queries related to defect knowledge and original knowledge and mitigating the modality bias issues. Experiments on in-house fab data show that FabGPT achieves significant performance improvement in wafer defect detection and knowledge querying.
CVMar 31, 2024Code
Transformer based Pluralistic Image Completion with Reduced Information LossQiankun Liu, Yuqi Jiang, Zhentao Tan et al.
Transformer based methods have achieved great success in image inpainting recently. However, we find that these solutions regard each pixel as a token, thus suffering from an information loss issue from two aspects: 1) They downsample the input image into much lower resolutions for efficiency consideration. 2) They quantize $256^3$ RGB values to a small number (such as 512) of quantized color values. The indices of quantized pixels are used as tokens for the inputs and prediction targets of the transformer. To mitigate these issues, we propose a new transformer based framework called "PUT". Specifically, to avoid input downsampling while maintaining computation efficiency, we design a patch-based auto-encoder P-VQVAE. The encoder converts the masked image into non-overlapped patch tokens and the decoder recovers the masked regions from the inpainted tokens while keeping the unmasked regions unchanged. To eliminate the information loss caused by input quantization, an Un-quantized Transformer is applied. It directly takes features from the P-VQVAE encoder as input without any quantization and only regards the quantized tokens as prediction targets. Furthermore, to make the inpainting process more controllable, we introduce semantic and structural conditions as extra guidance. Extensive experiments show that our method greatly outperforms existing transformer based methods on image fidelity and achieves much higher diversity and better fidelity than state-of-the-art pluralistic inpainting methods on complex large-scale datasets (e.g., ImageNet). Codes are available at https://github.com/liuqk3/PUT.
LGNov 13, 2025
Unitho: A Unified Multi-Task Framework for Computational LithographyQian Jin, Yumeng Liu, Yuqi Jiang et al.
Reliable, generalizable data foundations are critical for enabling large-scale models in computational lithography. However, essential tasks-mask generation, rule violation detection, and layout optimization-are often handled in isolation, hindered by scarce datasets and limited modeling approaches. To address these challenges, we introduce Unitho, a unified multi-task large vision model built upon the Transformer architecture. Trained on a large-scale industrial lithography simulation dataset with hundreds of thousands of cases, Unitho supports end-to-end mask generation, lithography simulation, and rule violation detection. By enabling agile and high-fidelity lithography simulation, Unitho further facilitates the construction of robust data foundations for intelligent EDA. Experimental results validate its effectiveness and generalizability, with performance substantially surpassing academic baselines.
LGFeb 18, 2024
Interpretable Short-Term Load Forecasting via Multi-Scale Temporal DecompositionYuqi Jiang, Yan Li, Yize Chen
Rapid progress in machine learning and deep learning has enabled a wide range of applications in the electricity load forecasting of power systems, for instance, univariate and multivariate short-term load forecasting. Though the strong capabilities of learning the non-linearity of the load patterns and the high prediction accuracy have been achieved, the interpretability of typical deep learning models for electricity load forecasting is less studied. This paper proposes an interpretable deep learning method, which learns a linear combination of neural networks that each attends to an input time feature. We also proposed a multi-scale time series decomposition method to deal with the complex time patterns. Case studies have been carried out on the Belgium central grid load dataset and the proposed model demonstrated better accuracy compared to the frequently applied baseline model. Specifically, the proposed multi-scale temporal decomposition achieves the best MSE, MAE and RMSE of 0.52, 0.57 and 0.72 respectively. As for interpretability, on one hand, the proposed method displays generalization capability. On the other hand, it can demonstrate not only the feature but also the temporal interpretability compared to other baseline methods. Besides, the global time feature interpretabilities are also obtained. Obtaining global feature interpretabilities allows us to catch the overall patterns, trends, and cyclicality in load data while also revealing the significance of various time-related features in forming the final outputs.
CVFeb 15, 2025
SEM-CLIP: Precise Few-Shot Learning for Nanoscale Defect Detection in Scanning Electron Microscope ImageQian Jin, Yuqi Jiang, Xudong Lu et al.
In the field of integrated circuit manufacturing, the detection and classification of nanoscale wafer defects are critical for subsequent root cause analysis and yield enhancement. The complex background patterns observed in scanning electron microscope (SEM) images and the diverse textures of the defects pose significant challenges. Traditional methods usually suffer from insufficient data, labels, and poor transferability. In this paper, we propose a novel few-shot learning approach, SEM-CLIP, for accurate defect classification and segmentation. SEM-CLIP customizes the Contrastive Language-Image Pretraining (CLIP) model to better focus on defect areas and minimize background distractions, thereby enhancing segmentation accuracy. We employ text prompts enriched with domain knowledge as prior information to assist in precise analysis. Additionally, our approach incorporates feature engineering with textual guidance to categorize defects more effectively. SEM-CLIP requires little annotated data, substantially reducing labor demands in the semiconductor industry. Extensive experimental validation demonstrates that our model achieves impressive classification and segmentation results under few-shot learning scenarios.
CVMay 17, 2023
CS-PCN: Context-Space Progressive Collaborative Network for Image DenoisingYuqi Jiang, Chune Zhang, Jiao Liu
Currently, image-denoising methods based on deep learning cannot adequately reconcile contextual semantic information and spatial details. To take these information optimizations into consideration, in this paper, we propose a Context-Space Progressive Collaborative Network (CS-PCN) for image denoising. CS-PCN is a multi-stage hierarchical architecture composed of a context mining siamese sub-network (CM2S) and a space synthesis sub-network (3S). CM2S aims at extracting rich multi-scale contextual information by sequentially connecting multi-layer feature processors (MLFP) for semantic information pre-processing, attention encoder-decoders (AED) for multi-scale information, and multi-conv attention controllers (MCAC) for supervised feature fusion. 3S parallels MLFP and a single-scale cascading block to learn image details, which not only maintains the contextual information but also emphasizes the complementary spatial ones. Experimental results show that CS-PCN achieves significant performance improvement in synthetic and real-world noise removal.
SPMay 5, 2023
Tiny-PPG: A Lightweight Deep Neural Network for Real-Time Detection of Motion Artifacts in Photoplethysmogram Signals on Edge DevicesYali Zheng, Chen Wu, Peizheng Cai et al.
Photoplethysmogram (PPG) signals are easily contaminated by motion artifacts in real-world settings, despite their widespread use in Internet-of-Things (IoT) based wearable and smart health devices for cardiovascular health monitoring. This study proposed a lightweight deep neural network, called Tiny-PPG, for accurate and real-time PPG artifact segmentation on IoT edge devices. The model was trained and tested on a public dataset, PPG DaLiA, which featured complex artifacts with diverse lengths and morphologies during various daily activities of 15 subjects using a watch-type device (Empatica E4). The model structure, training method and loss function were specifically designed to balance detection accuracy and speed for real-time PPG artifact detection in resource-constrained embedded devices. To optimize the model size and capability in multi-scale feature representation, the model employed depth-wise separable convolution and atrous spatial pyramid pooling modules, respectively. Additionally, the contrastive loss was also utilized to further optimize the feature embeddings. With additional model pruning, Tiny-PPG achieved state-of-the-art detection accuracy of 87.4% while only having 19,726 model parameters (0.15 megabytes), and was successfully deployed on an STM32 embedded system for real-time PPG artifact detection. Therefore, this study provides an effective solution for resource-constraint IoT smart health devices in PPG artifact detection.