Deval Shah

Tharun Adithya Srikrishnan, Deval Shah, Steven K. Reinhardt

Large vision-language models (VLMs) enable the joint processing of text and images. However, the inclusion of vision data significantly expands the prompt length. Along with the quadratic complexity of the attention computation, this results in a longer prefill duration. An approach to mitigate this bottleneck is to leverage the inherent sparsity in the attention computation. In our analysis of attention patterns in VLMs, we observe that a substantial portion of layers exhibit minimal cross-image attention, except through attention-sink tokens per image. These sparse attention patterns fall into distinct categories: sink-only, document mask and a hybrid document-sink mask. Based on this, we propose BlindSight: a training-free approach to optimize VLM inference using a input template-aware attention sparsity mask. We utilize samples from a dataset to derive a prompt-agnostic sparsity categorization for every attention head. We evaluate the proposed technique using VLMs such as Qwen2-VL, Qwen2.5-VL and Gemma-3. BlindSight results in a 32%-41% reduction in FLOPs on average with -2%-+2% accuracy compared to the original model in most evaluated multi-image understanding benchmarks.

Deval Shah, Zi Yu Xue, Karthik Pattabiraman et al.

Motion planning is a computationally intensive and well-studied problem in autonomous robots. However, motion planning hardware accelerators (MPA) must be soft-error resilient for deployment in safety-critical applications, and blanket application of traditional mitigation techniques is ill-suited due to cost, power, and performance overheads. We propose Collision Exposure Factor (CEF), a novel metric to assess the failure vulnerability of circuits processing spatial relationships, including motion planning. CEF is based on the insight that the safety violation probability increases with the surface area of the physical space exposed by a bit-flip. We evaluate CEF on four MPAs. We demonstrate empirically that CEF is correlated with safety violation probability, and that CEF-aware selective error mitigation provides 12.3x, 9.6x, and 4.2x lower Failures-In-Time (FIT) rate on average for the same amount of protected memory compared to uniform, bit-position, and access-frequency-aware selection of critical data. Furthermore, we show how to employ CEF to enable fault characterization using 23,000x fewer fault injection (FI) experiments than exhaustive FI, and evaluate our FI approach on different robots and MPAs. We demonstrate that CEF-aware FI can provide insights on vulnerable bits in an MPA while taking the same amount of time as uniform statistical FI. Finally, we use the CEF to formulate guidelines for designing soft-error resilient MPAs.