Chukwufumnanya Ogbogu

h-index44
2papers

2 Papers

ETAug 22, 2025
HePGA: A Heterogeneous Processing-in-Memory based GNN Training Accelerator

Chukwufumnanya Ogbogu, Gaurav Narang, Biresh Kumar Joardar et al.

Processing-In-Memory (PIM) architectures offer a promising approach to accelerate Graph Neural Network (GNN) training and inference. However, various PIM devices such as ReRAM, FeFET, PCM, MRAM, and SRAM exist, with each device offering unique trade-offs in terms of power, latency, area, and non-idealities. A heterogeneous manycore architecture enabled by 3D integration can combine multiple PIM devices on a single platform, to enable energy-efficient and high-performance GNN training. In this work, we propose a 3D heterogeneous PIM-based accelerator for GNN training referred to as HePGA. We leverage the unique characteristics of GNN layers and associated computing kernels to optimize their mapping on to different PIM devices as well as planar tiers. Our experimental analysis shows that HePGA outperforms existing PIM-based architectures by up to 3.8x and 6.8x in energy-efficiency (TOPS/W) and compute efficiency (TOPS/mm2) respectively, without sacrificing the GNN prediction accuracy. Finally, we demonstrate the applicability of HePGA to accelerate inferencing of emerging transformer models.

ARJan 19, 2024
FARe: Fault-Aware GNN Training on ReRAM-based PIM Accelerators

Pratyush Dhingra, Chukwufumnanya Ogbogu, Biresh Kumar Joardar et al.

Resistive random-access memory (ReRAM)-based processing-in-memory (PIM) architecture is an attractive solution for training Graph Neural Networks (GNNs) on edge platforms. However, the immature fabrication process and limited write endurance of ReRAMs make them prone to hardware faults, thereby limiting their widespread adoption for GNN training. Further, the existing fault-tolerant solutions prove inadequate for effectively training GNNs in the presence of faults. In this paper, we propose a fault-aware framework referred to as FARe that mitigates the effect of faults during GNN training. FARe outperforms existing approaches in terms of both accuracy and timing overhead. Experimental results demonstrate that FARe framework can restore GNN test accuracy by 47.6% on faulty ReRAM hardware with a ~1% timing overhead compared to the fault-free counterpart.