T. Nathan Mundhenk

Ian A. Palmer, T. Nathan Mundhenk, Brian Gallagher et al.

We recently developed a deep learning method that can determine the critical peak stress of a material by looking at scanning electron microscope (SEM) images of the material's crystals. However, it has been somewhat unclear what kind of image features the network is keying off of when it makes its prediction. It is common in computer vision to employ an explainable AI saliency map to tell one what parts of an image are important to the network's decision. One can usually deduce the important features by looking at these salient locations. However, SEM images of crystals are more abstract to the human observer than natural image photographs. As a result, it is not easy to tell what features are important at the locations which are most salient. To solve this, we developed a method that helps us map features from important locations in SEM images to non-abstract textures that are easier to interpret.

T. Nathan Mundhenk, Barry Y. Chen, Gerald Friedland

We describe an explainable AI saliency map method for use with deep convolutional neural networks (CNN) that is much more efficient than popular fine-resolution gradient methods. It is also quantitatively similar or better in accuracy. Our technique works by measuring information at the end of each network scale which is then combined into a single saliency map. We describe how saliency measures can be made more efficient by exploiting Saliency Map Order Equivalence. We visualize individual scale/layer contributions by using a Layer Ordered Visualization of Information. This provides an interesting comparison of scale information contributions within the network not provided by other saliency map methods. Using our method instead of Guided Backprop, coarse-resolution class activation methods such as Grad-CAM and Grad-CAM++ seem to yield demonstrably superior results without sacrificing speed. This will make fine-resolution saliency methods feasible on resource limited platforms such as robots, cell phones, low-cost industrial devices, astronomy and satellite imagery.

T. Nathan Mundhenk, Daniel Ho, Barry Y. Chen

We develop a set of methods to improve on the results of self-supervised learning using context. We start with a baseline of patch based arrangement context learning and go from there. Our methods address some overt problems such as chromatic aberration as well as other potential problems such as spatial skew and mid-level feature neglect. We prevent problems with testing generalization on common self-supervised benchmark tests by using different datasets during our development. The results of our methods combined yield top scores on all standard self-supervised benchmarks, including classification and detection on PASCAL VOC 2007, segmentation on PASCAL VOC 2012, and "linear tests" on the ImageNet and CSAIL Places datasets. We obtain an improvement over our baseline method of between 4.0 to 7.1 percentage points on transfer learning classification tests. We also show results on different standard network architectures to demonstrate generalization as well as portability. All data, models and programs are available at: https://gdo-datasci.llnl.gov/selfsupervised/.