SYMay 3, 2024
Reliable Interval Prediction of Minimum Operating Voltage Based on On-chip Monitors via Conformalized Quantile RegressionYuxuan Yin, Xiaoxiao Wang, Rebecca Chen et al.
Predicting the minimum operating voltage ($V_{min}$) of chips is one of the important techniques for improving the manufacturing testing flow, as well as ensuring the long-term reliability and safety of in-field systems. Current $V_{min}$ prediction methods often provide only point estimates, necessitating additional techniques for constructing prediction confidence intervals to cover uncertainties caused by different sources of variations. While some existing techniques offer region predictions, but they rely on certain distributional assumptions and/or provide no coverage guarantees. In response to these limitations, we propose a novel distribution-free $V_{min}$ interval estimation methodology possessing a theoretical guarantee of coverage. Our approach leverages conformalized quantile regression and on-chip monitors to generate reliable prediction intervals. We demonstrate the effectiveness of the proposed method on an industrial 5nm automotive chip dataset. Moreover, we show that the use of on-chip monitors can reduce the interval length significantly for $V_{min}$ prediction.
LGAug 21, 2025
Transfer Learning for Minimum Operating Voltage Prediction in Advanced Technology Nodes: Leveraging Legacy Data and Silicon Odometer SensingYuxuan Yin, Rebecca Chen, Boxun Xu et al.
Accurate prediction of chip performance is critical for ensuring energy efficiency and reliability in semiconductor manufacturing. However, developing minimum operating voltage ($V_{min}$) prediction models at advanced technology nodes is challenging due to limited training data and the complex relationship between process variations and $V_{min}$. To address these issues, we propose a novel transfer learning framework that leverages abundant legacy data from the 16nm technology node to enable accurate $V_{min}$ prediction at the advanced 5nm node. A key innovation of our approach is the integration of input features derived from on-chip silicon odometer sensor data, which provide fine-grained characterization of localized process variations -- an essential factor at the 5nm node -- resulting in significantly improved prediction accuracy.