MTRL-SCIJan 9
Autonomous Probe Microscopy with Robust Bag-of-Features Multi-Objective Bayesian Optimization: Pareto-Front Mapping of Nanoscale Structure-Property Trade-OffsKamyar Barakati, Haochen Zhu, C Charlotte Buchanan et al.
Combinatorial materials libraries are an efficient route to generate large families of candidate compositions, but their impact is often limited by the speed and depth of characterization and by the difficulty of extracting actionable structure-property relations from complex characterization data. Here we develop an autonomous scanning probe microscopy (SPM) framework that integrates automated atomic force and magnetic force microscopy (AFM/MFM) to rapidly explore magnetic and structural properties across combinatorial spread libraries. To enable automated exploration of systems without a clear optimization target, we introduce a combination of a static physics-informed bag-of-features (BoF) representation of measured surface morphology and magnetic structure with multi-objective Bayesian optimization (MOBO) to discover the relative significance and robustness of features. The resulting closed-loop workflow selectively samples the compositional gradient and reconstructs feature landscapes consistent with dense grid "ground truth" measurements. The resulting Pareto structure reveals where multiple nanoscale objectives are simultaneously optimized, where trade-offs between roughness, coherence, and magnetic contrast are unavoidable, and how families of compositions cluster into distinct functional regimes, thereby turning multi-feature imaging data into interpretable maps of competing structure-property trends. While demonstrated for Au-Co-Ni and AFM/MFM, the approach is general and can be extended to other combinatorial systems, imaging modalities, and feature sets, illustrating how feature-based MOBO and autonomous SPM can transform microscopy images from static data products into active feedback for real-time, multi-objective materials discovery.
COMP-PHAug 1, 2024
Invariant Discovery of Features Across Multiple Length Scales: Applications in Microscopy and Autonomous Materials CharacterizationAditya Raghavan, Utkarsh Pratiush, Mani Valleti et al.
Physical imaging is a foundational characterization method in areas from condensed matter physics and chemistry to astronomy and spans length scales from atomic to universe. Images encapsulate crucial data regarding atomic bonding, materials microstructures, and dynamic phenomena such as microstructural evolution and turbulence, among other phenomena. The challenge lies in effectively extracting and interpreting this information. Variational Autoencoders (VAEs) have emerged as powerful tools for identifying underlying factors of variation in image data, providing a systematic approach to distilling meaningful patterns from complex datasets. However, a significant hurdle in their application is the definition and selection of appropriate descriptors reflecting local structure. Here we introduce the scale-invariant VAE approach (SI-VAE) based on the progressive training of the VAE with the descriptors sampled at different length scales. The SI-VAE allows the discovery of the length scale dependent factors of variation in the system. Here, we illustrate this approach using the ferroelectric domain images and generalize it to the movies of the electron-beam induced phenomena in graphene and topography evolution across combinatorial libraries. This approach can further be used to initialize the decision making in automated experiments including structure-property discovery and can be applied across a broad range of imaging methods. This approach is universal and can be applied to any spatially resolved data including both experimental imaging studies and simulations, and can be particularly useful for exploration of phenomena such as turbulence, scale-invariant transformation fronts, etc.