Peter Binev

Peter Binev, Andrea Bonito, Ronald DeVore et al.

This paper studies the problem of learning an unknown function $f$ from given data about $f$. The learning problem is to give an approximation $\hat f$ to $f$ that predicts the values of $f$ away from the data. There are numerous settings for this learning problem depending on (i) what additional information we have about $f$ (known as a model class assumption), (ii) how we measure the accuracy of how well $\hat f$ predicts $f$, (iii) what is known about the data and data sites, (iv) whether the data observations are polluted by noise. A mathematical description of the optimal performance possible (the smallest possible error of recovery) is known in the presence of a model class assumption. Under standard model class assumptions, it is shown in this paper that a near optimal $\hat f$ can be found by solving a certain discrete over-parameterized optimization problem with a penalty term. Here, near optimal means that the error is bounded by a fixed constant times the optimal error. This explains the advantage of over-parameterization which is commonly used in modern machine learning. The main results of this paper prove that over-parameterized learning with an appropriate loss function gives a near optimal approximation $\hat f$ of the function $f$ from which the data is collected. Quantitative bounds are given for how much over-parameterization needs to be employed and how the penalization needs to be scaled in order to guarantee a near optimal recovery of $f$. An extension of these results to the case where the data is polluted by additive deterministic noise is also given.

Peter Binev, Albert Cohen, Wolfgang Dahmen et al.

We consider the problem of optimal recovery of an element $u$ of a Hilbert space $\mathcal{H}$ from $m$ measurements obtained through known linear functionals on $\mathcal{H}$. Problems of this type are well studied \cite{MRW} under an assumption that $u$ belongs to a prescribed model class, e.g. a known compact subset of $\mathcal{H}$. Motivated by reduced modeling for parametric partial differential equations, this paper considers another setting where the additional information about $u$ is in the form of how well $u$ can be approximated by a certain known subspace $V_n$ of $\mathcal{H}$ of dimension $n$, or more generally, how well $u$ can be approximated by each $k$-dimensional subspace $V_k$ of a sequence of nested subspaces $V_0\subset V_1\cdots\subset V_n$. A recovery algorithm for the one-space formulation, proposed in \cite{MPPY}, is proven here to be optimal and to have a simple formulation, if certain favorable bases are chosen to represent $V_n$ and the measurements. The major contribution of the present paper is to analyze the multi-space case for which it is shown that the set of all $u$ satisfying the given information can be described as the intersection of a family of known ellipsoids in $\mathcal{H}$. It follows that a near optimal recovery algorithm in the multi-space problem is to identify any point in this intersection which can provide a much better accuracy than in the one-space problem. Two iterative algorithms based on alternating projections are proposed for recovery in the multi-space problem. A detailed analysis of one of them provides a posteriori performance estimates for the iterates, stopping criteria, and convergence rates. Since the limit of the algorithm is a point in the intersection of the aforementioned ellipsoids, it provides a near optimal recovery for $u$.

Benjamin Berkels, Peter Binev, Douglas A. Blom et al.

The extraordinary improvements of modern imaging devices offer access to data with unprecedented information content. However, widely used image processing methodologies fall far short of exploiting the full breadth of information offered by numerous types of scanning probe, optical, and electron microscopies. In many applications, it is necessary to keep measurement intensities below a desired threshold. We propose a methodology for extracting an increased level of information by processing a series of data sets suffering, in particular, from high degree of spatial uncertainty caused by complex multiscale motion during the acquisition process. An important role is played by a nonrigid pixel-wise registration method that can cope with low signal-to-noise ratios. This is accompanied by formulating objective quality measures which replace human intervention and visual inspection in the processing chain. Scanning transmission electron microscopy of siliceous zeolite material exhibits the above-mentioned obstructions and therefore serves as orientation and a test of our procedures.