Khouloud Abdelli, Danish Rafique, Helmut Griesser et al.
A novel approach based on an artificial neural network (ANN) for lifetime prediction of 1.55 um InGaAsP MQW-DFB laser diodes is presented. It outperforms the conventional lifetime projection using accelerated aging tests.
Khouloud Abdelli, Danish Rafique, Stephan Pachnicke
Laser degradation analysis is a crucial process for the enhancement of laser reliability. Here, we propose a data-driven fault detection approach based on Long Short-Term Memory (LSTM) recurrent neural networks to detect the different laser degradation modes based on synthetic historical failure data. In comparison to typical threshold-based systems, attaining 24.41% classification accuracy, the LSTM-based model achieves 95.52% accuracy, and also outperforms classical machine learning (ML) models namely Random Forest (RF), K-Nearest Neighbours (KNN) and Logistic Regression (LR).