AIJun 1
Bridging the Sim-to-Real Gap in Semiconductor Visual Program Synthesis via Input BinarizationYusuke Ohtsubo, Kota Dohi, Koichiro Yawata et al.
Precise parametric control over circuit geometry is essential for semiconductor inspection, yet obtaining sufficient real training data remains costly. Although generative models such as diffusion models and Generative Adversarial Networks (GANs) can augment training data, they cannot guarantee the nanometer-scale geometric accuracy required for metrology tasks. We propose a visual program synthesis framework in which a Vision-Language Model (VLM) converts inspection images into editable Domain-Specific Language (DSL) code describing circuit geometries, enabling controlled generation of training data with exact parameter manipulation. Because the VLM is trained solely on synthetic DSL-rendered data, a domain gap arises when processing real Scanning Electron Microscope (SEM) images. We bridge this gap with an input binarization strategy that strips SEM-specific texture and noise, letting the model focus on geometric structure. On the MIIC dataset, binarized inputs improve the mean Dice coefficient from 0.4393 to 0.5256 over the raw-input baseline, demonstrating that simple texture abstraction substantially mitigates the sim-to-real gap.
CVApr 24, 2022
A Comparative Study of Meter Detection Methods for Automated Infrastructure InspectionYusuke Ohtsubo, Takuto Sato, Hirohiko Sagawa
In order to read meter values from a camera on an autonomous inspection robot with positional errors, it is necessary to detect meter regions from the image. In this study, we developed shape-based, texture-based, and background information-based methods as meter area detection techniques and compared their effectiveness for meters of different shapes and sizes. As a result, we confirmed that the background information-based method can detect the farthest meters regardless of the shape and number of meters, and can stably detect meters with a diameter of 40px.
CVMay 22, 2021
Semi-Supervised Few-Shot Classification with Deep Invertible Hybrid ModelsYusuke Ohtsubo, Tetsu Matsukawa, Einoshin Suzuki
In this paper, we propose a deep invertible hybrid model which integrates discriminative and generative learning at a latent space level for semi-supervised few-shot classification. Various tasks for classifying new species from image data can be modeled as a semi-supervised few-shot classification, which assumes a labeled and unlabeled training examples and a small support set of the target classes. Predicting target classes with a few support examples per class makes the learning task difficult for existing semi-supervised classification methods, including selftraining, which iteratively estimates class labels of unlabeled training examples to learn a classifier for the training classes. To exploit unlabeled training examples effectively, we adopt as the objective function the composite likelihood, which integrates discriminative and generative learning and suits better with deep neural networks than the parameter coupling prior, the other popular integrated learning approach. In our proposed model, the discriminative and generative models are respectively Prototypical Networks, which have shown excellent performance in various kinds of few-shot learning, and Normalizing Flow a deep invertible model which returns the exact marginal likelihood unlike the other three major methods, i.e., VAE, GAN, and autoregressive model. Our main originality lies in our integration of these components at a latent space level, which is effective in preventing overfitting. Experiments using mini-ImageNet and VGG-Face datasets show that our method outperforms selftraining based Prototypical Networks.