4.1OCApr 7, 2025
Online Cluster-Based Parameter Control for MetaheuristicVasileios A. Tatsis, Dimos Ioannidis
The concept of parameter setting is a crucial and significant process in metaheuristics since it can majorly impact their performance. It is a highly complex and challenging procedure since it requires a deep understanding of the optimization algorithm and the optimization problem at hand. In recent years, the upcoming rise of autonomous decision systems has attracted ongoing scientific interest in this direction, utilizing a considerable number of parameter-tuning methods. There are two types of methods: offline and online. Online methods usually excel in complex real-world problems, as they can offer dynamic parameter control throughout the execution of the algorithm. The present work proposes a general-purpose online parameter-tuning method called Cluster-Based Parameter Adaptation (CPA) for population-based metaheuristics. The main idea lies in the identification of promising areas within the parameter search space and in the generation of new parameters around these areas. The method's validity has been demonstrated using the differential evolution algorithm and verified in established test suites of low- and high-dimensional problems. The obtained results are statistically analyzed and compared with state-of-the-art algorithms, including advanced auto-tuning approaches. The analysis reveals the promising solid CPA's performance as well as its robustness under a variety of benchmark problems and dimensions.
1.2CVFeb 25, 2020
A Deep Learning Framework for Simulation and Defect Prediction Applied in MicroelectronicsNikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis et al.
The prediction of upcoming events in industrial processes has been a long-standing research goal since it enables optimization of manufacturing parameters, planning of equipment maintenance and more importantly prediction and eventually prevention of defects. While existing approaches have accomplished substantial progress, they are mostly limited to processing of one dimensional signals or require parameter tuning to model environmental parameters. In this paper, we propose an alternative approach based on deep neural networks that simulates changes in the 3D structure of a monitored object in a batch based on previous 3D measurements. In particular, we propose an architecture based on 3D Convolutional Neural Networks (3DCNN) in order to model the geometric variations in manufacturing parameters and predict upcoming events related to sub-optimal performance. We validate our framework on a microelectronics use-case using the recently published PCB scans dataset where we simulate changes on the shape and volume of glue deposited on an Liquid Crystal Polymer (LCP) substrate before the attachment of integrated circuits (IC). Experimental evaluation examines the impact of different choices in the cost function during training and shows that the proposed method can be efficiently used for defect prediction.