Prad Kadambi

Weizhi Li, Prad Kadambi, Pouria Saidi et al.

A two-sample hypothesis test is a statistical procedure used to determine whether the distributions generating two samples are identical. We consider the two-sample testing problem in a new scenario where the sample measurements (or sample features) are inexpensive to access, but their group memberships (or labels) are costly. To address the problem, we devise the first \emph{active sequential two-sample testing framework} that not only sequentially but also \emph{actively queries}. Our test statistic is a likelihood ratio where one likelihood is found by maximization over all class priors, and the other is provided by a probabilistic classification model. The classification model is adaptively updated and used to predict where the (unlabelled) features have a high dependency on labels; labeling the ``high-dependency'' features leads to the increased power of the proposed testing framework. In theory, we provide the proof that our framework produces an \emph{anytime-valid} $p$-value. In addition, we characterize the proposed framework's gain in testing power by analyzing the mutual information between the feature and label variables in asymptotic and finite-sample scenarios. In practice, we introduce an instantiation of our framework and evaluate it using several experiments; the experiments on the synthetic, MNIST, and application-specific datasets demonstrate that the testing power of the instantiated active sequential test significantly increases while the Type I error is under control.

Chuteng Zhou, Prad Kadambi, Matthew Mattina et al.

The success of deep learning has brought forth a wave of interest in computer hardware design to better meet the high demands of neural network inference. In particular, analog computing hardware has been heavily motivated specifically for accelerating neural networks, based on either electronic, optical or photonic devices, which may well achieve lower power consumption than conventional digital electronics. However, these proposed analog accelerators suffer from the intrinsic noise generated by their physical components, which makes it challenging to achieve high accuracy on deep neural networks. Hence, for successful deployment on analog accelerators, it is essential to be able to train deep neural networks to be robust to random continuous noise in the network weights, which is a somewhat new challenge in machine learning. In this paper, we advance the understanding of noisy neural networks. We outline how a noisy neural network has reduced learning capacity as a result of loss of mutual information between its input and output. To combat this, we propose using knowledge distillation combined with noise injection during training to achieve more noise robust networks, which is demonstrated experimentally across different networks and datasets, including ImageNet. Our method achieves models with as much as two times greater noise tolerance compared with the previous best attempts, which is a significant step towards making analog hardware practical for deep learning.