Li-Hao Yeh

Ruiming Cao, Fanglin Linda Liu, Li-Hao Yeh et al. · berkeley

Structured illumination microscopy (SIM) reconstructs a super-resolved image from multiple raw images captured with different illumination patterns; hence, acquisition speed is limited, making it unsuitable for dynamic scenes. We propose a new method, Speckle Flow SIM, that uses static patterned illumination with moving samples and models the sample motion during data capture in order to reconstruct the dynamic scene with super-resolution. Speckle Flow SIM relies on sample motion to capture a sequence of raw images. The spatio-temporal relationship of the dynamic scene is modeled using a neural space-time model with coordinate-based multi-layer perceptrons (MLPs), and the motion dynamics and the super-resolved scene are jointly recovered. We validate Speckle Flow SIM for coherent imaging in simulation and build a simple, inexpensive experimental setup with off-the-shelf components. We demonstrate that Speckle Flow SIM can reconstruct a dynamic scene with deformable motion and 1.88x the diffraction-limited resolution in experiment.

Li-Hao Yeh, Lei Tian, Laura Waller

Structured illumination microscopy (SIM) improves resolution by down-modulating high-frequency information of an object to fit within the passband of the optical system. Generally, the reconstruction process requires prior knowledge of the illumination patterns, which implies a well-calibrated and aberration-free system. Here, we propose a new \textit{algorithmic self-calibration} strategy for SIM that does not need to know the exact patterns {\it a priori}, but only their covariance. The algorithm, termed PE-SIMS, includes a Pattern-Estimation (PE) step requiring the uniformity of the sum of the illumination patterns and a SIM reconstruction procedure using a Statistical prior (SIMS). Additionally, we perform a pixel reassignment process (SIMS-PR) to enhance the reconstruction quality. We achieve 2$\times$ better resolution than a conventional widefield microscope, while remaining insensitive to aberration-induced pattern distortion and robust against parameter tuning.