Wojciech Rudno-Rudziński

David Jacob Kedziora, Anna Musiał, Wojciech Rudno-Rudziński et al.

The use of single-photon sources (SPSs) is central to numerous systems and devices proposed amidst a modern surge in quantum technology. However, manufacturing schemes remain imperfect, and single-photon emission purity must often be experimentally verified via interferometry. Such a process is typically slow and costly, which has motivated growing research into whether SPS quality can be more rapidly inferred from incomplete emission statistics. Hence, this study is a sequel to previous work that demonstrated significant uncertainty in the standard method of quality estimation, i.e. the least-squares fitting of a physically motivated function, and asks: can machine learning (ML) do better? The study leverages eight datasets obtained from measurements involving an exemplary quantum emitter, i.e. a single InGaAs/GaAs epitaxial quantum dot; these eight contexts predominantly vary in the intensity of the exciting laser. Specifically, via a form of `transfer learning', five ML models, three linear and two ensemble-based, are trained on data from seven of the contexts and tested on the eighth. Validation metrics quickly reveal that even a linear regressor can outperform standard fitting when it is tested on the same contexts it was trained on, but the success of transfer learning is less assured, even though statistical analysis, made possible by data augmentation, suggests its superiority as an early estimator. Accordingly, the study concludes by discussing future strategies for grappling with the problem of SPS context dissimilarity, e.g. feature engineering and model adaptation.

David Jacob Kedziora, Anna Musiał, Wojciech Rudno-Rudziński et al.

Novel methods for rapidly estimating single-photon source (SPS) quality have been promoted in recent literature to address the expensive and time-consuming nature of experimental validation via intensity interferometry. However, the frequent lack of uncertainty discussions and reproducible details raises concerns about their reliability. This study investigates the use of data augmentation, a machine learning technique, to supplement experimental data with bootstrapped samples and quantify the uncertainty of such estimates. Eight datasets obtained from measurements involving a single InGaAs/GaAs epitaxial quantum dot serve as a proof-of-principle example. Analysis of one of the SPS quality metrics derived from efficient histogram fitting of the synthetic samples, i.e. the probability of multi-photon emission events, reveals significant uncertainty contributed by stochastic variability in the Poisson processes that describe detection rates. Ignoring this source of error risks severe overconfidence in both early quality estimates and claims for state-of-the-art SPS devices. Additionally, this study finds that standard least-squares fitting is comparable to using a Poisson likelihood, and expanding averages show some promise for early estimation. Also, reducing background counts improves fitting accuracy but does not address the Poisson-process variability. Ultimately, data augmentation demonstrates its value in supplementing physical experiments; its benefit here is to emphasise the need for a cautious assessment of SPS quality.