Peter Kietzmann

2papers

2 Papers

ARJul 13, 2023
Ageing Analysis of Embedded SRAM on a Large-Scale Testbed Using Machine Learning

Leandro Lanzieri, Peter Kietzmann, Goerschwin Fey et al.

Ageing detection and failure prediction are essential in many Internet of Things (IoT) deployments, which operate huge quantities of embedded devices unattended in the field for years. In this paper, we present a large-scale empirical analysis of natural SRAM wear-out using 154 boards from a general-purpose testbed. Starting from SRAM initialization bias, which each node can easily collect at startup, we apply various metrics for feature extraction and experiment with common machine learning methods to predict the age of operation for this node. Our findings indicate that even though ageing impacts are subtle, our indicators can well estimate usage times with an $R^2$ score of 0.77 and a mean error of 24% using regressors, and with an F1 score above 0.6 for classifiers applying a six-months resolution.

CRJul 23, 2020
A Guideline on Pseudorandom Number Generation (PRNG) in the IoT

Peter Kietzmann, Thomas C. Schmidt, Matthias Wählisch

Random numbers are an essential input to many functions on the Internet of Things (IoT). Common use cases of randomness range from low-level packet transmission to advanced algorithms of artificial intelligence as well as security and trust, which heavily rely on unpredictable random sources. In the constrained IoT, though, unpredictable random sources are a challenging desire due to limited resources, deterministic real-time operations, and frequent lack of a user interface. In this paper, we revisit the generation of randomness from the perspective of an IoT operating system (OS) that needs to support general purpose or crypto-secure random numbers. We analyse the potential attack surface, derive common requirements, and discuss the potentials and shortcomings of current IoT OSs. A systematic evaluation of current IoT hardware components and popular software generators based on well-established test suits and on experiments for measuring performance give rise to a set of clear recommendations on how to build such a random subsystem and which generators to use.