Maria Antonietta Pascali

Francesco Conti, Martina Banchelli, Valentina Bessi et al.

The cerebrospinal fluid (CSF) of 19 subjects who received a clinical diagnosis of Alzheimer's disease (AD) as well as of 5 pathological controls have been collected and analysed by Raman spectroscopy (RS). We investigated whether the raw and preprocessed Raman spectra could be used to distinguish AD from controls. First, we applied standard Machine Learning (ML) methods obtaining unsatisfactory results. Then, we applied ML to a set of topological descriptors extracted from raw spectra, achieving a very good classification accuracy (>87%). Although our results are preliminary, they indicate that RS and topological analysis together may provide an effective combination to confirm or disprove a clinical diagnosis of AD. The next steps will include enlarging the dataset of CSF samples to validate the proposed method better and, possibly, to understand if topological data analysis could support the characterization of AD subtypes.

Francesco Conti, Davide Moroni, Maria Antonietta Pascali

In this work, we develop a pipeline that associates Persistence Diagrams to digital data via the most appropriate filtration for the type of data considered. Using a grid search approach, this pipeline determines optimal representation methods and parameters. The development of such a topological pipeline for Machine Learning involves two crucial steps that strongly affect its performance: firstly, digital data must be represented as an algebraic object with a proper associated filtration in order to compute its topological summary, the Persistence Diagram. Secondly, the persistence diagram must be transformed with suitable representation methods in order to be introduced in a Machine Learning algorithm. We assess the performance of our pipeline, and in parallel, we compare the different representation methods on popular benchmark datasets. This work is a first step toward both an easy and ready-to-use pipeline for data classification using persistent homology and Machine Learning, and to understand the theoretical reasons why, given a dataset and a task to be performed, a pair (filtration, topological representation) is better than another.

Bilal Hussain, Bushra Jalil, Maria Antonietta Pascali et al.

Failure prediction of any electrical/optical component is crucial for estimating its operating life. Using high temperature operating life (HTOL) tests, it is possible to model the failure mechanisms for integrated circuits. Conventional HTOL standards are not suitable for operating life prediction of photonic components owing to their functional dependence on thermo-optic effect. This work presents an IR-assisted thermal vulnerability detection technique suitable for photonic as well as electronic components. By accurately mapping the thermal profile of an integrated circuit under a stress condition, it is possible to precisely locate the heat center for predicting the long-term operational failures within the device under test. For the first time, the reliability testing is extended to a fully functional microwave photonic system using conventional IR thermography. By applying image fusion using affine transformation on multimodal acquisition, it was demonstrated that by comparing the IR profile and GDSII layout, it is possible to accurately locate the heat centers along with spatial information on the type of component. Multiple IR profiles of optical as well as electrical components/circuits were acquired and mapped onto the layout files. In order to ascertain the degree of effectiveness of the proposed technique, IR profiles of CMOS RF and digital circuits were also analyzed. The presented technique offers a reliable automated identification of heat spots within a circuit/system.