Yves-Marie Saint Drenan

2papers

2 Papers

CVJul 31, 2024
Space-scale Exploration of the Poor Reliability of Deep Learning Models: the Case of the Remote Sensing of Rooftop Photovoltaic Systems

Gabriel Kasmi, Laurent Dubus, Yves-Marie Saint Drenan et al.

Photovoltaic (PV) energy grows rapidly and is crucial for the decarbonization of electric systems. However, centralized registries recording the technical characteristifs of rooftop PV systems are often missing, making it difficult to accurately monitor this growth. The lack of monitoring could threaten the integration of PV energy into the grid. To avoid this situation, the remote sensing of rooftop PV systems using deep learning emerged as a promising solution. However, existing techniques are not reliable enough to be used by public authorities or transmission system operators (TSOs) to construct up-to-date statistics on the rooftop PV fleet. The lack of reliability comes from the fact that deep learning models are sensitive to distribution shifts. This work proposes a comprehensive evaluation of the effects of distribution shifts on the classification accuracy of deep learning models trained to detect rooftop PV panels on overhead imagery. We construct a benchmark to isolate the sources of distribution shift and introduce a novel methodology that leverages explainable artificial intelligence (XAI) and decomposition of the input image and model's decision in terms of scales to understand how distribution shifts affect deep learning models. Finally, based on our analysis, we introduce a data augmentation technique meant to improve the robustness of deep learning classifiers to varying acquisition conditions. We show that our proposed approach outperforms competing methods. We discuss some practical recommendations for mapping PV systems using overhead imagery and deep learning models.

CVMay 24, 2023Code
Assessment of the Reliablity of a Model's Decision by Generalizing Attribution to the Wavelet Domain

Gabriel Kasmi, Laurent Dubus, Yves-Marie Saint Drenan et al.

Neural networks have shown remarkable performance in computer vision, but their deployment in numerous scientific and technical fields is challenging due to their black-box nature. Scientists and practitioners need to evaluate the reliability of a decision, i.e., to know simultaneously if a model relies on the relevant features and whether these features are robust to image corruptions. Existing attribution methods aim to provide human-understandable explanations by highlighting important regions in the image domain, but fail to fully characterize a decision process's reliability. To bridge this gap, we introduce the Wavelet sCale Attribution Method (WCAM), a generalization of attribution from the pixel domain to the space-scale domain using wavelet transforms. Attribution in the wavelet domain reveals where and on what scales the model focuses, thus enabling us to assess whether a decision is reliable. Our code is accessible here: \url{https://github.com/gabrielkasmi/spectral-attribution}.