Vladyslav Andriiashen

Vladyslav Andriiashen, Robert van Liere, Tristan van Leeuwen et al.

Background: X-ray imaging is widely used for the non-destructive detection of defects in industrial products on a conveyor belt. In-line detection requires highly accurate, robust, and fast algorithms. Deep Convolutional Neural Networks (DCNNs) satisfy these requirements when a large amount of labeled data is available. To overcome the challenge of collecting these data, different methods of X-ray image generation are considered. Objective: Depending on the desired degree of similarity to real data, different physical effects should either be simulated or can be ignored. X-ray scattering is known to be computationally expensive to simulate, and this effect can greatly affect the accuracy of a generated X-ray image. We aim to quantitatively evaluate the effect of scattering on defect detection. Methods: Monte-Carlo simulation is used to generate X-ray scattering distribution. DCNNs are trained on the data with and without scattering and applied to the same test datasets. Probability of Detection (POD) curves are computed to compare their performance, characterized by the size of the smallest detectable defect. Results: We apply the methodology to a model problem of defect detection in cylinders. When trained on data without scattering, DCNNs reliably detect defects larger than 1.3 mm, and using data with scattering improves performance by less than 5%. If the analysis is performed on the cases with large scattering-to-primary ratio ($1 < SPR < 5$), the difference in performance could reach 15% (approx. 0.4 mm). Conclusion: Excluding the scattering signal from the training data has the largest effect on the smallest detectable defects, and the difference decreases for larger defects. The scattering-to-primary ratio has a significant effect on detection performance and the required accuracy of data generation.

Vladyslav Andriiashen, Robert van Liere, Tristan van Leeuwen et al.

X-ray imaging is a widely used technique for non-destructive inspection of agricultural food products. One application of X-ray imaging is the autonomous, in-line detection of foreign objects in food samples. Examples of such inclusions are bone fragments in meat products, plastic and metal debris in fish, fruit infestations. This article presents a processing methodology for unsupervised foreign object detection based on dual-energy X-ray absorptiometry (DEXA). A foreign object is defined as a fragment of material with different X-ray attenuation properties than those belonging to the food product. A novel thickness correction model is introduced as a pre-processing technique for DEXA data. The aim of the model is to homogenize regions in the image that belong to the food product and enhance contrast where the foreign object is present. In this way, the segmentation of the foreign object is more robust to noise and lack of contrast. The proposed methodology was applied to a dataset of 488 samples of meat products. The samples were acquired from a conveyor belt in a food processing factory. Approximately 60\% of the samples contain foreign objects of different types and sizes, while the rest of the samples are void of foreign objects. The results show that samples without foreign objects are correctly identified in 97% of cases, the overall accuracy of foreign object detection reaches 95%.

Sophia Bethany Coban, Vladyslav Andriiashen, Poulami Somanya Ganguly et al.

We present three parallel-beam tomographic datasets of 94 apples with internal defects along with defect label files. The datasets are prepared for development and testing of data-driven, learning-based image reconstruction, segmentation and post-processing methods. The three versions are a noiseless simulation; simulation with added Gaussian noise, and with scattering noise. The datasets are based on real 3D X-ray CT data and their subsequent volume reconstructions. The ground truth images, based on the volume reconstructions, are also available through this project. Apples contain various defects, which naturally introduce a label bias. We tackle this by formulating the bias as an optimization problem. In addition, we demonstrate solving this problem with two methods: a simple heuristic algorithm and through mixed integer quadratic programming. This ensures the datasets can be split into test, training or validation subsets with the label bias eliminated. Therefore the datasets can be used for image reconstruction, segmentation, automatic defect detection, and testing the effects of (as well as applying new methodologies for removing) label bias in machine learning.