IVMay 22, 2023
Quantifying the effect of X-ray scattering for data generation in real-time defect detectionVladyslav Andriiashen, Robert van Liere, Tristan van Leeuwen et al.
Background: X-ray imaging is widely used for the non-destructive detection of defects in industrial products on a conveyor belt. In-line detection requires highly accurate, robust, and fast algorithms. Deep Convolutional Neural Networks (DCNNs) satisfy these requirements when a large amount of labeled data is available. To overcome the challenge of collecting these data, different methods of X-ray image generation are considered. Objective: Depending on the desired degree of similarity to real data, different physical effects should either be simulated or can be ignored. X-ray scattering is known to be computationally expensive to simulate, and this effect can greatly affect the accuracy of a generated X-ray image. We aim to quantitatively evaluate the effect of scattering on defect detection. Methods: Monte-Carlo simulation is used to generate X-ray scattering distribution. DCNNs are trained on the data with and without scattering and applied to the same test datasets. Probability of Detection (POD) curves are computed to compare their performance, characterized by the size of the smallest detectable defect. Results: We apply the methodology to a model problem of defect detection in cylinders. When trained on data without scattering, DCNNs reliably detect defects larger than 1.3 mm, and using data with scattering improves performance by less than 5%. If the analysis is performed on the cases with large scattering-to-primary ratio ($1 < SPR < 5$), the difference in performance could reach 15% (approx. 0.4 mm). Conclusion: Excluding the scattering signal from the training data has the largest effect on the smallest detectable defects, and the difference decreases for larger defects. The scattering-to-primary ratio has a significant effect on detection performance and the required accuracy of data generation.
CVJan 28, 2022
A tomographic workflow to enable deep learning for X-ray based foreign object detectionMathé T. Zeegers, Tristan van Leeuwen, Daniël M. Pelt et al.
Detection of unwanted (`foreign') objects within products is a common procedure in many branches of industry for maintaining production quality. X-ray imaging is a fast, non-invasive and widely applicable method for foreign object detection. Deep learning has recently emerged as a powerful approach for recognizing patterns in radiographs (i.e., X-ray images), enabling automated X-ray based foreign object detection. However, these methods require a large number of training examples and manual annotation of these examples is a subjective and laborious task. In this work, we propose a Computed Tomography (CT) based method for producing training data for supervised learning of foreign object detection, with minimal labour requirements. In our approach, a few representative objects are CT scanned and reconstructed in 3D. The radiographs that have been acquired as part of the CT-scan data serve as input for the machine learning method. High-quality ground truth locations of the foreign objects are obtained through accurate 3D reconstructions and segmentations. Using these segmented volumes, corresponding 2D segmentations are obtained by creating virtual projections. We outline the benefits of objectively and reproducibly generating training data in this way compared to conventional radiograph annotation. In addition, we show how the accuracy depends on the number of objects used for the CT reconstructions. The results show that in this workflow generally only a relatively small number of representative objects (i.e., fewer than 10) are needed to achieve adequate detection performance in an industrial setting. Moreover, for real experimental data we show that the workflow leads to higher foreign object detection accuracies than with standard radiograph annotation.
IVApr 12, 2021
Unsupervised foreign object detection based on dual-energy absorptiometry in the food industryVladyslav Andriiashen, Robert van Liere, Tristan van Leeuwen et al.
X-ray imaging is a widely used technique for non-destructive inspection of agricultural food products. One application of X-ray imaging is the autonomous, in-line detection of foreign objects in food samples. Examples of such inclusions are bone fragments in meat products, plastic and metal debris in fish, fruit infestations. This article presents a processing methodology for unsupervised foreign object detection based on dual-energy X-ray absorptiometry (DEXA). A foreign object is defined as a fragment of material with different X-ray attenuation properties than those belonging to the food product. A novel thickness correction model is introduced as a pre-processing technique for DEXA data. The aim of the model is to homogenize regions in the image that belong to the food product and enhance contrast where the foreign object is present. In this way, the segmentation of the foreign object is more robust to noise and lack of contrast. The proposed methodology was applied to a dataset of 488 samples of meat products. The samples were acquired from a conveyor belt in a food processing factory. Approximately 60\% of the samples contain foreign objects of different types and sizes, while the rest of the samples are void of foreign objects. The results show that samples without foreign objects are correctly identified in 97% of cases, the overall accuracy of foreign object detection reaches 95%.