Eliyahu Osherovich, Oren Cohen, Yonina C. Eldar et al.
We present a novel method for Ankylography: three-dimensional structure reconstruction from a single shot diffraction intensity pattern. Our approach allows reconstruction of objects containing many more details than was ever demonstrated, in a faster and more accurate fashion
Ron Ziv, Alex Dikopoltsev, Tom Zahavy et al.
We propose a simple all-in-line single-shot scheme for diagnostics of ultrashort laser pulses, consisting of a multi-mode fiber, a nonlinear crystal and a CCD camera. The system records a 2D spatial intensity pattern, from which the pulse shape (amplitude and phase) are recovered, through a fast Deep Learning algorithm. We explore this scheme in simulations and demonstrate the recovery of ultrashort pulses, robustness to noise in measurements and to inaccuracies in the parameters of the system components. Our technique mitigates the need for commonly used iterative optimization reconstruction methods, which are usually slow and hampered by the presence of noise. These features make our concept system advantageous for real time probing of ultrafast processes and noisy conditions. Moreover, this work exemplifies that using deep learning we can unlock new types of systems for pulse recovery.
Tom Zahavy, Alex Dikopoltsev, Oren Cohen et al.
Ultra-short laser pulses with femtosecond to attosecond pulse duration are the shortest systematic events humans can create. Characterization (amplitude and phase) of these pulses is a key ingredient in ultrafast science, e.g., exploring chemical reactions and electronic phase transitions. Here, we propose and demonstrate, numerically and experimentally, the first deep neural network technique to reconstruct ultra-short optical pulses. We anticipate that this approach will extend the range of ultrashort laser pulses that can be characterized, e.g., enabling to diagnose very weak attosecond pulses.
Shahar Tsiper, Or Dicker, Idan Kaizerman et al.
The scanning electron microscope (SEM) produces an image of a sample by scanning it with a focused beam of electrons. The electrons interact with the atoms in the sample, which emit secondary electrons that contain information about the surface topography and composition. The sample is scanned by the electron beam point by point, until an image of the surface is formed. Since its invention in 1942, SEMs have become paramount in the discovery and understanding of the nanometer world, and today it is extensively used for both research and in industry. In principle, SEMs can achieve resolution better than one nanometer. However, for many applications, working at sub-nanometer resolution implies an exceedingly large number of scanning points. For exactly this reason, the SEM diagnostics of microelectronic chips is performed either at high resolution (HR) over a small area or at low resolution (LR) while capturing a larger portion of the chip. Here, we employ sparse coding and dictionary learning to algorithmically enhance LR SEM images of microelectronic chips up to the level of the HR images acquired by slow SEM scans, while considerably reducing the noise. Our methodology consists of two steps: an offline stage of learning a joint dictionary from a sequence of LR and HR images of the same region in the chip, followed by a fast-online super-resolution step where the resolution of a new LR image is enhanced. We provide several examples with typical chips used in the microelectronics industry, as well as a statistical study on arbitrary images with characteristic structural features. Conceptually, our method works well when the images have similar characteristics. This work demonstrates that employing sparsity concepts can greatly improve the performance of SEM, thereby considerably increasing the scanning throughput without compromising on analysis quality and resolution.