Eric Pop

Keming Fan, Ashkan Moradifirouzabadi, Xiangjin Wu et al.

Mass spectrometry (MS) is essential for proteomics and metabolomics but faces impending challenges in efficiently processing the vast volumes of data. This paper introduces SpecPCM, an in-memory computing (IMC) accelerator designed to achieve substantial improvements in energy and delay efficiency for both MS spectral clustering and database (DB) search. SpecPCM employs analog processing with low-voltage swing and utilizes recently introduced phase change memory (PCM) devices based on superlattice materials, optimized for low-voltage and low-power programming. Our approach integrates contributions across multiple levels: application, algorithm, circuit, device, and instruction sets. We leverage a robust hyperdimensional computing (HD) algorithm with a novel dimension-packing method and develop specialized hardware for the end-to-end MS pipeline to overcome the non-ideal behavior of PCM devices. We further optimize multi-level PCM devices for different tasks by using different materials. We also perform a comprehensive design exploration to improve energy and delay efficiency while maintaining accuracy, exploring various combinations of hardware and software parameters controlled by the instruction set architecture (ISA). SpecPCM, with up to three bits per cell, achieves speedups of up to 82x and 143x for MS clustering and DB search tasks, respectively, along with a four-orders-of-magnitude improvement in energy efficiency compared with state-of-the-art CPU/GPU tools.

Robert K. A. Bennett, Jan-Lucas Uslu, Harmon F. Gault et al.

We present a deep learning approach to extract physical parameters (e.g., mobility, Schottky contact barrier height, defect profiles) of two-dimensional (2D) transistors from electrical measurements, enabling automated parameter extraction and technology computer-aided design (TCAD) fitting. To facilitate this task, we implement a simple data augmentation and pre-training approach by training a secondary neural network to approximate a physics-based device simulator. This method enables high-quality fits after training the neural network on electrical data generated from physics-based simulations of ~500 devices, a factor >40$\times$ fewer than other recent efforts. Consequently, fitting can be achieved by training on physically rigorous TCAD models, including complex geometry, self-consistent transport, and electrostatic effects, and is not limited to computationally inexpensive compact models. We apply our approach to reverse-engineer key parameters from experimental monolayer WS$_2$ transistors, achieving a median coefficient of determination ($R^2$) = 0.99 when fitting measured electrical data. We also demonstrate that this approach generalizes and scales well by reverse-engineering electrical data on high-electron-mobility transistors while fitting 35 parameters simultaneously. To facilitate future research on deep learning approaches for inverse transistor design, we have published our code and sample data sets online.