Ping Huang

Haoping Bai, Shancong Mou, Tatiana Likhomanenko et al. · apple-ml

Despite progress in vision-based inspection algorithms, real-world industrial challenges -- specifically in data availability, quality, and complex production requirements -- often remain under-addressed. We introduce the VISION Datasets, a diverse collection of 14 industrial inspection datasets, uniquely poised to meet these challenges. Unlike previous datasets, VISION brings versatility to defect detection, offering annotation masks across all splits and catering to various detection methodologies. Our datasets also feature instance-segmentation annotation, enabling precise defect identification. With a total of 18k images encompassing 44 defect types, VISION strives to mirror a wide range of real-world production scenarios. By supporting two ongoing challenge competitions on the VISION Datasets, we hope to foster further advancements in vision-based industrial inspection.

Xuan Zhang, Shiyu Li, Xi Li et al.

Visual anomaly detection, an important problem in computer vision, is usually formulated as a one-class classification and segmentation task. The student-teacher (S-T) framework has proved to be effective in solving this challenge. However, previous works based on S-T only empirically applied constraints on normal data and fused multi-level information. In this study, we propose an improved model called DeSTSeg, which integrates a pre-trained teacher network, a denoising student encoder-decoder, and a segmentation network into one framework. First, to strengthen the constraints on anomalous data, we introduce a denoising procedure that allows the student network to learn more robust representations. From synthetically corrupted normal images, we train the student network to match the teacher network feature of the same images without corruption. Second, to fuse the multi-level S-T features adaptively, we train a segmentation network with rich supervision from synthetic anomaly masks, achieving a substantial performance improvement. Experiments on the industrial inspection benchmark dataset demonstrate that our method achieves state-of-the-art performance, 98.6% on image-level AUC, 75.8% on pixel-level average precision, and 76.4% on instance-level average precision.

Shancong Mou, Xiaoyi Gu, Meng Cao et al.

Generative adversarial networks (GANs), trained on a large-scale image dataset, can be a good approximator of the natural image manifold. GAN-inversion, using a pre-trained generator as a deep generative prior, is a promising tool for image restoration under corruptions. However, the performance of GAN-inversion can be limited by a lack of robustness to unknown gross corruptions, i.e., the restored image might easily deviate from the ground truth. In this paper, we propose a Robust GAN-inversion (RGI) method with a provable robustness guarantee to achieve image restoration under unknown \textit{gross} corruptions, where a small fraction of pixels are completely corrupted. Under mild assumptions, we show that the restored image and the identified corrupted region mask converge asymptotically to the ground truth. Moreover, we extend RGI to Relaxed-RGI (R-RGI) for generator fine-tuning to mitigate the gap between the GAN learned manifold and the true image manifold while avoiding trivial overfitting to the corrupted input image, which further improves the image restoration and corrupted region mask identification performance. The proposed RGI/R-RGI method unifies two important applications with state-of-the-art (SOTA) performance: (i) mask-free semantic inpainting, where the corruptions are unknown missing regions, the restored background can be used to restore the missing content; (ii) unsupervised pixel-wise anomaly detection, where the corruptions are unknown anomalous regions, the retrieved mask can be used as the anomalous region's segmentation mask.

Shancong Mou, Meng Cao, Haoping Bai et al.

Unsupervised pixel-level defective region segmentation is an important task in image-based anomaly detection for various industrial applications. The state-of-the-art methods have their own advantages and limitations: matrix-decomposition-based methods are robust to noise but lack complex background image modeling capability; representation-based methods are good at defective region localization but lack accuracy in defective region shape contour extraction; reconstruction-based methods detected defective region match well with the ground truth defective region shape contour but are noisy. To combine the best of both worlds, we present an unsupervised patch autoencoder based deep image decomposition (PAEDID) method for defective region segmentation. In the training stage, we learn the common background as a deep image prior by a patch autoencoder (PAE) network. In the inference stage, we formulate anomaly detection as an image decomposition problem with the deep image prior and domain-specific regularizations. By adopting the proposed approach, the defective regions in the image can be accurately extracted in an unsupervised fashion. We demonstrate the effectiveness of the PAEDID method in simulation studies and an industrial dataset in the case study.

Shancong Mou, Raviteja Vemulapalli, Shiyu Li et al.

Defect segmentation is crucial for quality control in advanced manufacturing, yet data scarcity poses challenges for state-of-the-art supervised deep learning. Synthetic defect data generation is a popular approach for mitigating data challenges. However, many current methods simply generate defects following a fixed set of rules, which may not directly relate to downstream task performance. This can lead to suboptimal performance and may even hinder the downstream task. To solve this problem, we leverage a novel bi-level optimization-based synthetic defect data generation framework. We use an online synthetic defect generation module grounded in the commonly-used Cut\&Paste framework, and adopt an efficient gradient-based optimization algorithm to solve the bi-level optimization problem. We achieve simultaneous training of the defect segmentation network, and learn various parameters of the data synthesis module by maximizing the validation performance of the trained defect segmentation network. Our experimental results on benchmark datasets under limited data settings show that the proposed bi-level optimization method can be used for learning the most effective locations for pasting synthetic defects thereby improving the segmentation performance by up to 18.3\% when compared to pasting defects at random locations. We also demonstrate up to 2.6\% performance gain by learning the importance weights for different augmentation-specific defect data sources when compared to giving equal importance to all the data sources.

Kaichao You, Guo Qin, Anchang Bao et al.

Convolution-BatchNorm (ConvBN) blocks are integral components in various computer vision tasks and other domains. A ConvBN block can operate in three modes: Train, Eval, and Deploy. While the Train mode is indispensable for training models from scratch, the Eval mode is suitable for transfer learning and beyond, and the Deploy mode is designed for the deployment of models. This paper focuses on the trade-off between stability and efficiency in ConvBN blocks: Deploy mode is efficient but suffers from training instability; Eval mode is widely used in transfer learning but lacks efficiency. To solve the dilemma, we theoretically reveal the reason behind the diminished training stability observed in the Deploy mode. Subsequently, we propose a novel Tune mode to bridge the gap between Eval mode and Deploy mode. The proposed Tune mode is as stable as Eval mode for transfer learning, and its computational efficiency closely matches that of the Deploy mode. Through extensive experiments in object detection, classification, and adversarial example generation across $5$ datasets and $12$ model architectures, we demonstrate that the proposed Tune mode retains the performance while significantly reducing GPU memory footprint and training time, thereby contributing efficient ConvBN blocks for transfer learning and beyond. Our method has been integrated into both PyTorch (general machine learning framework) and MMCV/MMEngine (computer vision framework). Practitioners just need one line of code to enjoy our efficient ConvBN blocks thanks to PyTorch's builtin machine learning compilers.