Casey J. Pellizzari

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2papers

2 Papers

IVJul 4, 2025
Inverse Synthetic Aperture Fourier Ptychography

Matthew A. Chan, Casey J. Pellizzari, Christopher A. Metzler

Fourier ptychography (FP) is a powerful light-based synthetic aperture imaging technique that allows one to reconstruct a high-resolution, wide field-of-view image by computationally integrating a diverse collection of low-resolution, far-field measurements. Typically, FP measurement diversity is introduced by changing the angle of the illumination or the position of the camera; either approach results in sampling different portions of the target's spatial frequency content, but both approaches introduce substantial costs and complexity to the acquisition process. In this work, we introduce Inverse Synthetic Aperture Fourier Ptychography, a novel approach to FP that foregoes changing the illumination angle or camera position and instead generates measurement diversity through target motion. Critically, we also introduce a novel learning-based method for estimating k-space coordinates from dual plane intensity measurements, thereby enabling synthetic aperture imaging without knowing the rotation of the target. We experimentally validate our method in simulation and on a tabletop optical system.

DATA-ANJun 9, 2017
Phase-error estimation and image reconstruction from digital-holography data using a Bayesian framework

Casey J. Pellizzari, Mark F. Spencer, Charles A. Bouman

The estimation of phase errors from digital-holography data is critical for applications such as imaging or wave-front sensing. Conventional techniques require multiple i.i.d. data and perform poorly in the presence of high noise or large phase errors. In this paper we propose a method to estimate isoplanatic phase errors from a single data realization. We develop a model-based iterative reconstruction algorithm which computes the maximum a posteriori estimate of the phase and the speckle-free object reflectance. Using simulated data, we show that the algorithm is robust against high noise and strong phase errors.