MTRL-SCIOct 18, 2021
Graph convolutional network for predicting abnormal grain growth in Monte Carlo simulations of microstructural evolutionRyan Cohn, Elizabeth Holm
Recent developments in graph neural networks show promise for predicting the occurrence of abnormal grain growth, which has been a particularly challenging area of research due to its apparent stochastic nature. In this study, we generate a large dataset of Monte Carlo simulations of abnormal grain growth. We train simple graph convolution networks to predict which initial microstructures will exhibit abnormal grain growth, and compare the results to a standard computer vision approach for the same task. The graph neural network outperformed the computer vision method and achieved 73% prediction accuracy and fewer false positives. It also provided some physical insight into feature importance and the relevant length scale required to maximize predictive performance. Analysis of the uncertainty in the Monte Carlo simulations provides additional insights for ongoing work in this area.
MTRL-SCIJul 16, 2020
Unsupervised machine learning via transfer learning and k-means clustering to classify materials image dataRyan Cohn, Elizabeth Holm
Unsupervised machine learning offers significant opportunities for extracting knowledge from unlabeled data sets and for achieving maximum machine learning performance. This paper demonstrates how to construct, use, and evaluate a high performance unsupervised machine learning system for classifying images in a popular microstructural dataset. The Northeastern University Steel Surface Defects Database includes micrographs of six different defects observed on hot-rolled steel in a format that is convenient for training and evaluating models for image classification. We use the VGG16 convolutional neural network pre-trained on the ImageNet dataset of natural images to extract feature representations for each micrograph. After applying principal component analysis to extract signal from the feature descriptors, we use k-means clustering to classify the images without needing labeled training data. The approach achieves $99.4\% \pm 0.16\%$ accuracy, and the resulting model can be used to classify new images without retraining This approach demonstrates an improvement in both performance and utility compared to a previous study. A sensitivity analysis is conducted to better understand the influence of each step on the classification performance. The results provide insight toward applying unsupervised machine learning techniques to problems of interest in materials science.
CVMay 28, 2020
Overview: Computer vision and machine learning for microstructural characterization and analysisElizabeth A. Holm, Ryan Cohn, Nan Gao et al.
The characterization and analysis of microstructure is the foundation of microstructural science, connecting the materials structure to its composition, process history, and properties. Microstructural quantification traditionally involves a human deciding a priori what to measure and then devising a purpose-built method for doing so. However, recent advances in data science, including computer vision (CV) and machine learning (ML) offer new approaches to extracting information from microstructural images. This overview surveys CV approaches to numerically encode the visual information contained in a microstructural image, which then provides input to supervised or unsupervised ML algorithms that find associations and trends in the high-dimensional image representation. CV/ML systems for microstructural characterization and analysis span the taxonomy of image analysis tasks, including image classification, semantic segmentation, object detection, and instance segmentation. These tools enable new approaches to microstructural analysis, including the development of new, rich visual metrics and the discovery of processing-microstructure-property relationships.