Mariafrancesca Patalano

Mariafrancesca Patalano, Giovanna Capizzi, Kamran Paynabar

Modern sensing technologies have enabled the collection of unstructured point cloud data (PCD) of varying sizes, which are used to monitor the geometric accuracy of 3D objects. PCD are widely applied in advanced manufacturing processes, including additive, subtractive, and hybrid manufacturing. To ensure the consistency of analysis and avoid false alarms, preprocessing steps such as registration and mesh reconstruction are commonly applied prior to monitoring. However, these steps are error-prone, time-consuming and may introduce artifacts, potentially affecting monitoring outcomes. In this paper, we present a novel registration-free approach for monitoring PCD of complex shapes, eliminating the need for both registration and mesh reconstruction. Our proposal consists of two alternative feature learning methods and a common monitoring scheme. Feature learning methods leverage intrinsic geometric properties of the shape, captured via the Laplacian and geodesic distances. In the monitoring scheme, thresholding techniques are used to further select intrinsic features most indicative of potential out-of-control conditions. Numerical experiments and case studies highlight the effectiveness of the proposed approach in identifying different types of defects.

Mariafrancesca Patalano, Giovanna Capizzi, Kamran Paynabar

Advanced manufacturing technologies allow for the production of intricate parts featuring high shape complexity and spatially-varying material composition. Data fusion of point clouds with chromatic attributes provides 4D point clouds, a compact and informative representation that encodes both shape and material information. In this paper, we present a registration-free framework for Simultaneous Monitoring of shApe and Color (SMAC) via 4D point clouds. The proposed framework leverages Laplace-Beltrami operator spectral properties to capture and monitor geometric features and the relationship between shape and surface color. A combined monitoring scheme is proposed to effectively detect shape deformations and color anomalies, along with a spatially-aware post-signal diagnostic procedure to determine the source of change and localize color anomalies. Importantly, neither component relies on registration or mesh reconstruction, eliminating error-prone and computationally expensive preprocessing steps. A Monte Carlo simulation study and a case study on functionally graded materials demonstrate that SMAC achieves effective detection performance, particularly for subtle defects, while providing diagnostic capabilities to identify the source and location of anomalies.