Perm: A Parametric Representation for Multi-Style 3D Hair ModelingChengan He, Xin Sun, Zhixin Shu et al.
We present Perm, a learned parametric representation of human 3D hair designed to facilitate various hair-related applications. Unlike previous work that jointly models the global hair structure and local curl patterns, we propose to disentangle them using a PCA-based strand representation in the frequency domain, thereby allowing more precise editing and output control. Specifically, we leverage our strand representation to fit and decompose hair geometry textures into low- to high-frequency hair structures, termed guide textures and residual textures, respectively. These decomposed textures are later parameterized with different generative models, emulating common stages in the hair grooming process. We conduct extensive experiments to validate the architecture design of Perm, and finally deploy the trained model as a generic prior to solve task-agnostic problems, further showcasing its flexibility and superiority in tasks such as single-view hair reconstruction, hairstyle editing, and hair-conditioned image generation. More details can be found on our project page: https://cs.yale.edu/homes/che/projects/perm/.
EllipBench: A Large-scale Benchmark for Machine-learning based Ellipsometry ModelingYiming Ma, Xinjie Li, Xin Sun et al.
Ellipsometry is used to indirectly measure the optical properties and thickness of thin films. However, solving the inverse problem of ellipsometry is time-consuming since it involves human expertise to apply the data fitting techniques. Many studies use traditional machine learning-based methods to model the complex mathematical fitting process. In our work, we approach this problem from a deep learning perspective. First, we introduce a large-scale benchmark dataset to facilitate deep learning methods. The proposed dataset encompasses 98 types of thin film materials and 4 types of substrate materials, including metals, alloys, compounds, and polymers, among others. Additionally, we propose a deep learning framework that leverages residual connections and self-attention mechanisms to learn the massive data points. We also introduce a reconstruction loss to address the common challenge of multiple solutions in thin film thickness prediction. Compared to traditional machine learning methods, our framework achieves state-of-the-art (SOTA) performance on our proposed dataset. The dataset and code will be available upon acceptance.