SPJun 15, 2021
Towards Long-term Non-invasive Monitoring for Epilepsy via Wearable EEG DevicesThorir Mar Ingolfsson, Andrea Cossettini, Xiaying Wang et al.
We present the implementation of seizure detection algorithms based on a minimal number of EEG channels on a parallel ultra-low-power embedded platform. The analyses are based on the CHB-MIT dataset, and include explorations of different classification approaches (Support Vector Machines, Random Forest, Extra Trees, AdaBoost) and different pre/post-processing techniques to maximize sensitivity while guaranteeing no false alarms. We analyze global and subject-specific approaches, considering all 23-electrodes or only 4 temporal channels. For 8s window size and subject-specific approach, we report zero false positives and 100% sensitivity. These algorithms are parallelized and optimized for a parallel ultra-low power (PULP) platform, enabling 300h of continuous monitoring on a 300 mAh battery, in a wearable form factor and power budget. These results pave the way for the implementation of affordable, wearable, long-term epilepsy monitoring solutions with low false-positive rates and high sensitivity, meeting both patient and caregiver requirements.
LGMay 21, 2021
Trimming Feature Extraction and Inference for MCU-based Edge NILM: a Systematic ApproachEnrico Tabanelli, Davide Brunelli, Andrea Acquaviva et al.
Non-Intrusive Load Monitoring (NILM) enables the disaggregation of the global power consumption of multiple loads, taken from a single smart electrical meter, into appliance-level details. State-of-the-Art approaches are based on Machine Learning methods and exploit the fusion of time- and frequency-domain features from current and voltage sensors. Unfortunately, these methods are compute-demanding and memory-intensive. Therefore, running low-latency NILM on low-cost, resource-constrained MCU-based meters is currently an open challenge. This paper addresses the optimization of the feature spaces as well as the computational and storage cost reduction needed for executing State-of-the-Art (SoA) NILM algorithms on memory- and compute-limited MCUs. We compare four supervised learning techniques on different classification scenarios and characterize the overall NILM pipeline's implementation on a MCU-based Smart Measurement Node. Experimental results demonstrate that optimizing the feature space enables edge MCU-based NILM with 95.15% accuracy, resulting in a small drop compared to the most-accurate feature vector deployment (96.19%) while achieving up to 5.45x speed-up and 80.56% storage reduction. Furthermore, we show that low-latency NILM relying only on current measurements reaches almost 80% accuracy, allowing a major cost reduction by removing voltage sensors from the hardware design.