Coherent microscopy techniques provide an unparalleled multi-scale view of materials across scientific and technological fields, from structural materials to quantum devices, from integrated circuits to biological cells. Driven by the construction of brighter sources and high-rate detectors, coherent X-ray microscopy methods like ptychography are poised to revolutionize nanoscale materials characterization. However, associated significant increases in data and compute needs mean that conventional approaches no longer suffice for recovering sample images in real-time from high-speed coherent imaging experiments. Here, we demonstrate a workflow that leverages artificial intelligence at the edge and high-performance computing to enable real-time inversion on X-ray ptychography data streamed directly from a detector at up to 2 kHz. The proposed AI-enabled workflow eliminates the sampling constraints imposed by traditional ptychography, allowing low dose imaging using orders of magnitude less data than required by traditional methods.
Noninvasive X-ray imaging of nanoscale three-dimensional objects, e.g. integrated circuits (ICs), generally requires two types of scanning: ptychographic, which is translational and returns estimates of complex electromagnetic field through ICs; and tomographic scanning, which collects complex field projections from multiple angles. Here, we present Attentional Ptycho-Tomography (APT), an approach trained to provide accurate reconstructions of ICs despite incomplete measurements, using a dramatically reduced amount of angular scanning. Training process includes regularizing priors based on typical IC patterns and the physics of X-ray propagation. We demonstrate that APT with 12-time reduced angles achieves fidelity comparable to the gold standard with the original set of angles. With the same set of reduced angles, APT also outperforms baseline reconstruction methods. In our experiments, APT achieves 108-time aggregate reduction in data acquisition and computation without compromising quality. We expect our physics-assisted machine learning framework could also be applied to other branches of nanoscale imaging.
Mohammad Rostami, Atik Faysal, Reihaneh Gh. Roshan et al.
Automatic Modulation Classification (AMC) is critical for efficient spectrum management and robust wireless communications. However, AMC remains challenging due to the complex interplay of signal interference and noise. In this work, we propose an innovative framework that integrates traditional signal processing techniques with Large-Language Models (LLMs) to address AMC. Our approach leverages higher-order statistics and cumulant estimation to convert quantitative signal features into structured natural language prompts. By incorporating exemplar contexts into these prompts, our method exploits the LLM's inherent familiarity with classical signal processing, enabling effective one-shot classification without additional training or preprocessing (e.g., denoising). Experimental evaluations on synthetically generated datasets, spanning both noiseless and noisy conditions, demonstrate that our framework achieves competitive performance across diverse modulation schemes and Signal-to-Noise Ratios (SNRs). Moreover, our approach paves the way for robust foundation models in wireless communications across varying channel conditions, significantly reducing the expense associated with developing channel-specific models. This work lays the foundation for scalable, interpretable, and versatile signal classification systems in next-generation wireless networks. The source code is available at https://github.com/RU-SIT/context-is-king
Yudong Yao, Henry Chan, Subramanian Sankaranarayanan et al.
The problem of phase retrieval, or the algorithmic recovery of lost phase information from measured intensity alone, underlies various imaging methods from astronomy to nanoscale imaging. Traditional methods of phase retrieval are iterative in nature, and are therefore computationally expensive and time consuming. More recently, deep learning (DL) models have been developed to either provide learned priors to iterative phase retrieval or in some cases completely replace phase retrieval with networks that learn to recover the lost phase information from measured intensity alone. However, such models require vast amounts of labeled data, which can only be obtained through simulation or performing computationally prohibitive phase retrieval on hundreds of or even thousands of experimental datasets. Using a 3D nanoscale X-ray imaging modality (Bragg Coherent Diffraction Imaging or BCDI) as a representative technique, we demonstrate AutoPhaseNN, a DL-based approach which learns to solve the phase problem without labeled data. By incorporating the physics of the imaging technique into the DL model during training, AutoPhaseNN learns to invert 3D BCDI data from reciprocal space to real space in a single shot without ever being shown real space images. Once trained, AutoPhaseNN is about one hundred times faster than traditional iterative phase retrieval methods while providing comparable image quality.