Wenbing Zhu

Ying Jin, Jinlong Peng, Qingdong He et al.

The performance of anomaly inspection in industrial manufacturing is constrained by the scarcity of anomaly data. To overcome this challenge, researchers have started employing anomaly generation approaches to augment the anomaly dataset. However, existing anomaly generation methods suffer from limited diversity in the generated anomalies and struggle to achieve a seamless blending of this anomaly with the original image. Moreover, the generated mask is usually not aligned with the generated anomaly. In this paper, we overcome these challenges from a new perspective, simultaneously generating a pair of the overall image and the corresponding anomaly part. We propose DualAnoDiff, a novel diffusion-based few-shot anomaly image generation model, which can generate diverse and realistic anomaly images by using a dual-interrelated diffusion model, where one of them is employed to generate the whole image while the other one generates the anomaly part. Moreover, we extract background and shape information to mitigate the distortion and blurriness phenomenon in few-shot image generation. Extensive experiments demonstrate the superiority of our proposed model over state-of-the-art methods in terms of diversity, realism and the accuracy of mask. Overall, our approach significantly improves the performance of downstream anomaly inspection tasks, including anomaly detection, anomaly localization, and anomaly classification tasks.

Yurui Pan, Lidong Wang, Yuchao Chen et al.

In industrial anomaly detection (IAD), accurately identifying defects amidst diverse anomalies and under varying imaging conditions remains a significant challenge. Traditional approaches often struggle with high false-positive rates, frequently misclassifying normal shadows and surface deformations as defects, an issue that becomes particularly pronounced in products with complex and intricate surface features. To address these challenges, we introduce PA-CLIP, a zero-shot anomaly detection method that reduces background noise and enhances defect detection through a pseudo-anomaly-based framework. The proposed method integrates a multiscale feature aggregation strategy for capturing detailed global and local information, two memory banks for distinguishing background information, including normal patterns and pseudo-anomalies, from true anomaly features, and a decision-making module designed to minimize false positives caused by environmental variations while maintaining high defect sensitivity. Demonstrated on the MVTec AD and VisA datasets, PA-CLIP outperforms existing zero-shot methods, providing a robust solution for industrial defect detection.