Christopher W. Thomas

Shancong Mou, Raviteja Vemulapalli, Shiyu Li et al.

Defect segmentation is crucial for quality control in advanced manufacturing, yet data scarcity poses challenges for state-of-the-art supervised deep learning. Synthetic defect data generation is a popular approach for mitigating data challenges. However, many current methods simply generate defects following a fixed set of rules, which may not directly relate to downstream task performance. This can lead to suboptimal performance and may even hinder the downstream task. To solve this problem, we leverage a novel bi-level optimization-based synthetic defect data generation framework. We use an online synthetic defect generation module grounded in the commonly-used Cut\&Paste framework, and adopt an efficient gradient-based optimization algorithm to solve the bi-level optimization problem. We achieve simultaneous training of the defect segmentation network, and learn various parameters of the data synthesis module by maximizing the validation performance of the trained defect segmentation network. Our experimental results on benchmark datasets under limited data settings show that the proposed bi-level optimization method can be used for learning the most effective locations for pasting synthetic defects thereby improving the segmentation performance by up to 18.3\% when compared to pasting defects at random locations. We also demonstrate up to 2.6\% performance gain by learning the importance weights for different augmentation-specific defect data sources when compared to giving equal importance to all the data sources.

Hadi Pouransari, David Grangier, C Thomas et al.

The impressive performance gains of modern language models currently rely on scaling parameters: larger models store more world knowledge and reason better. Yet compressing all world knowledge into parameters is unnecessary, as only a fraction is used per prompt, and impractical for edge devices with limited inference-time memory and compute. We address this shortcoming by a memory-augmented architecture and a pretraining strategy aligned with existing hardware paradigms. We introduce small language models that access large hierarchical parametric memory banks encoding world knowledge. During pretraining and inference, we fetch a small, context-dependent memory block and add it to the model. Our pretraining learns to store long-tail world knowledge in the memory parameters, while the small language model acts as an anchor capturing common knowledge and general reasoning abilities. Through trillion-token-scale experiments, we show significant gains: a 160M-parameters model augmented with an 18M-parameters memory fetched from a 4.6B memory bank obtains comparable performance to a regular model with more than 2x the parameters. Through extensive experiments, we study the optimal type and size of parametric memories in transformers, scaling them to over 21B parameters. We find that our proposed hierarchical feed-forward memories work robustly across transformer architectures, whether added during pretraining or post-hoc.