Oğuz Ergin

Umut Baser, Ismail Emir Yuksel, F. Nisa Bostanci et al.

We experimentally demonstrate that it is possible to generate unique, repeatable, and device-specific signatures suitable for use as Physical Unclonable Function (PUF) responses in commercial off-the-shelf (COTS) DRAM chips by leveraging simultaneous multiple-row activation (SiMRA). Based on a rigorous experimental characterization of 112 modern DDR4 DRAM chips (from 10 modules), we introduce SiMRA-PUF, the first DRAM-based PUF that uses SiMRA-generated signatures as PUF responses. We analyze SiMRA-PUF in terms of reliability, uniqueness, and evaluation latency for varying numbers of simultaneously activated DRAM rows (i.e., 2, 4, 8, 16, and 32), DRAM chip density & die revision, and evaluate how temperature affects the similarity of SiMRA-generated responses. Among our 8 key experimental observations, we highlight two major results. First, SiMRA-PUF provides average intra-Jaccard indices of 89.02%, 89.81%, 93.03%, 94.06%, and 94.86%, and average inter-Jaccard indices of 3.98%, 2.37%, 3.44%, 2.92%, and 3.24% for 2-, 4-, 8-, 16-, and 32-row activations, respectively, showing that SiMRA-generated signatures are both repeatable within a device and unique across devices. Second, 2-row activation-based SiMRA-PUF provides 5.75% lower evaluation latency than the state-of-the-art DRAM-based PUF. We open-source our infrastructure and datasets at https://github.com/CMU-SAFARI/SiMRA-PUF.

Ataberk Olgun, Minesh Patel, A. Giray Yağlıkçı et al.

True random number generators (TRNG) sample random physical processes to create large amounts of random numbers for various use cases, including security-critical cryptographic primitives, scientific simulations, machine learning applications, and even recreational entertainment. Unfortunately, not every computing system is equipped with dedicated TRNG hardware, limiting the application space and security guarantees for such systems. To open the application space and enable security guarantees for the overwhelming majority of computing systems that do not necessarily have dedicated TRNG hardware, we develop QUAC-TRNG. QUAC-TRNG exploits the new observation that a carefully-engineered sequence of DRAM commands activates four consecutive DRAM rows in rapid succession. This QUadruple ACtivation (QUAC) causes the bitline sense amplifiers to non-deterministically converge to random values when we activate four rows that store conflicting data because the net deviation in bitline voltage fails to meet reliable sensing margins. We experimentally demonstrate that QUAC reliably generates random values across 136 commodity DDR4 DRAM chips from one major DRAM manufacturer. We describe how to develop an effective TRNG (QUAC-TRNG) based on QUAC. We evaluate the quality of our TRNG using NIST STS and find that QUAC-TRNG successfully passes each test. Our experimental evaluations show that QUAC-TRNG generates true random numbers with a throughput of 3.44 Gb/s (per DRAM channel), outperforming the state-of-the-art DRAM-based TRNG by 15.08x and 1.41x for basic and throughput-optimized versions, respectively. We show that QUAC-TRNG utilizes DRAM bandwidth better than the state-of-the-art, achieving up to 2.03x the throughput of a throughput-optimized baseline when scaling bus frequencies to 12 GT/s.

Behzad Salami, Erhan Baturay Onural, Ismail Emir Yuksel et al.

We empirically evaluate an undervolting technique, i.e., underscaling the circuit supply voltage below the nominal level, to improve the power-efficiency of Convolutional Neural Network (CNN) accelerators mapped to Field Programmable Gate Arrays (FPGAs). Undervolting below a safe voltage level can lead to timing faults due to excessive circuit latency increase. We evaluate the reliability-power trade-off for such accelerators. Specifically, we experimentally study the reduced-voltage operation of multiple components of real FPGAs, characterize the corresponding reliability behavior of CNN accelerators, propose techniques to minimize the drawbacks of reduced-voltage operation, and combine undervolting with architectural CNN optimization techniques, i.e., quantization and pruning. We investigate the effect of environmental temperature on the reliability-power trade-off of such accelerators. We perform experiments on three identical samples of modern Xilinx ZCU102 FPGA platforms with five state-of-the-art image classification CNN benchmarks. This approach allows us to study the effects of our undervolting technique for both software and hardware variability. We achieve more than 3X power-efficiency (GOPs/W) gain via undervolting. 2.6X of this gain is the result of eliminating the voltage guardband region, i.e., the safe voltage region below the nominal level that is set by FPGA vendor to ensure correct functionality in worst-case environmental and circuit conditions. 43% of the power-efficiency gain is due to further undervolting below the guardband, which comes at the cost of accuracy loss in the CNN accelerator. We evaluate an effective frequency underscaling technique that prevents this accuracy loss, and find that it reduces the power-efficiency gain from 43% to 25%.