Kaiyang Zeng

Yao Shen, Ziwei Wei, Chunmeng Liu et al.

The Segment Anything Model (SAM) has demonstrated strong performance in image segmentation of natural scene images. However, its effectiveness diminishes markedly when applied to specific scientific domains, such as Scanning Probe Microscope (SPM) images. This decline in accuracy can be attributed to the distinct data distribution and limited availability of the data inherent in the scientific images. On the other hand, the acquisition of adequate SPM datasets is both time-intensive and laborious as well as skill-dependent. To address these challenges, we propose an Adaptive Prompt Learning with SAM (APL-SAM) framework tailored for few-shot SPM image segmentation. Our approach incorporates two key innovations to enhance SAM: 1) An Adaptive Prompt Learning module leverages few-shot embeddings derived from limited support set to learn adaptively central representatives, serving as visual prompts. This innovation eliminates the need for time-consuming online user interactions for providing prompts, such as exhaustively marking points and bounding boxes slice by slice; 2) A multi-source, multi-level mask decoder specifically designed for few-shot SPM image segmentation is introduced, which can effectively capture the correspondence between the support and query images. To facilitate comprehensive training and evaluation, we introduce a new dataset, SPM-Seg, curated for SPM image segmentation. Extensive experiments on this dataset reveal that the proposed APL-SAM framework significantly outperforms the original SAM, achieving over a 30% improvement in terms of Dice Similarity Coefficient with only one-shot guidance. Moreover, APL-SAM surpasses state-of-the-art few-shot segmentation methods and even fully supervised approaches in performance. Code and dataset used in this study will be made available upon acceptance.

Jiazhen Yan, Ziqiang Li, Fan Wang et al.

The rapid advancement of generative models has made real and synthetic images increasingly indistinguishable. Although extensive efforts have been devoted to detecting AI-generated images, out-of-distribution generalization remains a persistent challenge. We trace this weakness to spurious shortcuts exploited during training and we also observe that small feature-space perturbations can mitigate shortcut dominance. To address this problem in a more controllable manner, we propose the Positive-Incentive Noise for CLIP (PiN-CLIP), which jointly trains a noise generator and a detection network under a variational positive-incentive principle. Specifically, we construct positive-incentive noise in the feature space via cross-attention fusion of visual and categorical semantic features. During optimization, the noise is injected into the feature space to fine-tune the visual encoder, suppressing shortcut-sensitive directions while amplifying stable forensic cues, thereby enabling the extraction of more robust and generalized artifact representations. Comparative experiments are conducted on an open-world dataset comprising synthetic images generated by 42 distinct generative models. Our method achieves new state-of-the-art performance, with notable improvements of 5.4 in average accuracy over existing approaches.

Ziwei Wei, Shuming Wei, Qibin Zeng et al.

We have developed a Parallel Integrated Control and Training System, leveraging the deep reinforcement learning to dynamically adjust the control strategies in real time for scanning probe microscopy techniques.