Yee Sin Ang

Kavinda Athapaththu, Shiwei Chen, Yuan Fang et al.

The past few years have witnessed vibrant efforts in discovering new two-dimensional (2D) semiconductor materials from both academia and the industry, due to their promising potential in resolving the severe performance deterioration of traditional semiconductors resulting from condensed silicon thickness. However, existing methods (e.g., Density Functional Theory (DFT) or machine-learning-based approaches) suffer from various challenges such as small datasets, and reliability and trustworthiness issues. To bridge this gap, we propose SemiConLens, a visual analytics approach to combine human expertise with the power of ML to enable effective and reliable 2D semiconductor discovery. Specifically, we first develop a new Correlation Aware Multivariate Imputation (CAMI) method and use ML models like autoencoder, which can better learn from limited data and reveal uncertainty, to address the challenge of sparse data in semiconductivity prediction. Built upon this, our visualization module, consisting of three visualization views with linked interactions, allows material researchers to interactively filter, discover and compare 2D semiconductor candidates. A novel circular glyph design and a new cluster-aware layout optimization approach are proposed to effectively display all the user-configurable key attributes and possible prediction uncertainties of each semiconductor candidate, ensuring a reliable and trustable 2D semiconductor discovery. We assess SemiConLens through quantitative evaluations, expert interviews, and use cases. The results demonstrate SemiConLens's capability to help material researchers conduct effective discovery of desirable 2D semiconductors.

Tianning Zhang, Yee Sin Ang, Erping Li et al.

Metasurfaces have received a lot of attentions recently due to their versatile capability in manipulating electromagnetic wave. Advanced designs to satisfy multiple objectives with non-linear constraints have motivated researchers in using machine learning (ML) techniques like deep learning (DL) for accelerated design of metasurfaces. For metasurfaces, it is difficult to make quantitative comparisons between different ML models without having a common and yet complex dataset used in many disciplines like image classification. Many studies were directed to a relatively constrained datasets that are limited to specified patterns or shapes in metasurfaces. In this paper, we present our SUTD polarized reflection of complex metasurfaces (SUTD-PRCM) dataset, which contains approximately 260,000 samples of complex metasurfaces created from electromagnetic simulation, and it has been used to benchmark our DL models. The metasurface patterns are divided into different classes to facilitate different degree of complexity, which involves identifying and exploiting the relationship between the patterns and the electromagnetic responses that can be compared in using different DL models. With the release of this SUTD-PRCM dataset, we hope that it will be useful for benchmarking existing or future DL models developed in the ML community. We also propose a classification problem that is less encountered and apply neural architecture search to have a preliminary understanding of potential modification to the neural architecture that will improve the prediction by DL models. Our finding shows that convolution stacking is not the dominant element of the neural architecture anymore, which implies that low-level features are preferred over the traditional deep hierarchical high-level features thus explains why deep convolutional neural network based models are not performing well in our dataset.