Ryan Jacobs

CV
h-index3
3papers
15citations
Novelty28%
AI Score24

3 Papers

8.6MTRL-SCISep 9, 2024
Regression with Large Language Models for Materials and Molecular Property Prediction

Ryan Jacobs, Maciej P. Polak, Lane E. Schultz et al.

We demonstrate the ability of large language models (LLMs) to perform material and molecular property regression tasks, a significant deviation from the conventional LLM use case. We benchmark the Large Language Model Meta AI (LLaMA) 3 on several molecular properties in the QM9 dataset and 24 materials properties. Only composition-based input strings are used as the model input and we fine tune on only the generative loss. We broadly find that LLaMA 3, when fine-tuned using the SMILES representation of molecules, provides useful regression results which can rival standard materials property prediction models like random forest or fully connected neural networks on the QM9 dataset. Not surprisingly, LLaMA 3 errors are 5-10x higher than those of the state-of-the-art models that were trained using far more granular representation of molecules (e.g., atom types and their coordinates) for the same task. Interestingly, LLaMA 3 provides improved predictions compared to GPT-3.5 and GPT-4o. This work highlights the versatility of LLMs, suggesting that LLM-like generative models can potentially transcend their traditional applications to tackle complex physical phenomena, thus paving the way for future research and applications in chemistry, materials science and other scientific domains.

2.0CVAug 2, 2024
Accelerating Domain-Aware Electron Microscopy Analysis Using Deep Learning Models with Synthetic Data and Image-Wide Confidence Scoring

Matthew J. Lynch, Ryan Jacobs, Gabriella Bruno et al.

The integration of machine learning (ML) models enhances the efficiency, affordability, and reliability of feature detection in microscopy, yet their development and applicability are hindered by the dependency on scarce and often flawed manually labeled datasets and a lack of domain awareness. We addressed these challenges by creating a physics-based synthetic image and data generator, resulting in a machine learning model that achieves comparable precision (0.86), recall (0.63), F1 scores (0.71), and engineering property predictions (R2=0.82) to a model trained on human-labeled data. We enhanced both models by using feature prediction confidence scores to derive an image-wide confidence metric, enabling simple thresholding to eliminate ambiguous and out-of-domain images resulting in performance boosts of 5-30% with a filtering-out rate of 25%. Our study demonstrates that synthetic data can eliminate human reliance in ML and provides a means for domain awareness in cases where many feature detections per image are needed.

6.2CVJan 14, 2025Code
Predicting Performance of Object Detection Models in Electron Microscopy Using Random Forests

Ni Li, Ryan Jacobs, Matthew Lynch et al.

Quantifying prediction uncertainty when applying object detection models to new, unlabeled datasets is critical in applied machine learning. This study introduces an approach to estimate the performance of deep learning-based object detection models for quantifying defects in transmission electron microscopy (TEM) images, focusing on detecting irradiation-induced cavities in TEM images of metal alloys. We developed a random forest regression model that predicts the object detection F1 score, a statistical metric used to evaluate the ability to accurately locate and classify objects of interest. The random forest model uses features extracted from the predictions of the object detection model whose uncertainty is being quantified, enabling fast prediction on new, unlabeled images. The mean absolute error (MAE) for predicting F1 of the trained model on test data is 0.09, and the $R^2$ score is 0.77, indicating there is a significant correlation between the random forest regression model predicted and true defect detection F1 scores. The approach is shown to be robust across three distinct TEM image datasets with varying imaging and material domains. Our approach enables users to estimate the reliability of a defect detection and segmentation model predictions and assess the applicability of the model to their specific datasets, providing valuable information about possible domain shifts and whether the model needs to be fine-tuned or trained on additional data to be maximally effective for the desired use case.