Vinay Edula

Vinay Edula, Priyanka Bagade

Bounding-box regression is a fundamental component of object detection, playing a critical role in precise object localization. Existing Intersection-over-Union (IoU)-based loss functions extend the IoU objective by incorporating geometric penalties, such as center-distance and aspect-ratio mismatch, to improve bounding-box regression. However, these penalties typically remain fixed throughout training and do not account for the optimization dynamics in which predicted boxes initially exhibit large center-distance and shape errors, with later stages focusing on improving overlap with the ground truth. To address this limitation, we introduce MoEIoU, a mixture-of-experts based regression loss that jointly models overlap, center alignment, and aspect-ratio mismatch. MoEIoU aggregates these components using a log-sum-exp function, which emphasizes the dominant localization error while maintaining smooth contributions from other terms. Additionally, a curriculum-based weighting schedule is employed to prioritize correcting box position and shape in early training stages and improving overlap in later stages. We evaluated proposed MoEIoU on PASCAL VOC, HRIPCB, and MS COCO using multiple YOLO architectures, along with large-scale simulation experiments. It consistently outperforms standard and recent state-of-the-art losses, demonstrating faster convergence and improved localization accuracy. We further show that this adaptive aggregation improves existing IoU-based losses, yielding consistent gains and providing more effective optimization guidance for bounding-box regression in object detection frameworks.

Vinay Edula, Nilesh Badwe, Priyanka Bagade

Printed circuit board (PCB) defect detection is challenging because many defects are small and difficult to distinguish from complex background patterns. Most deep learning-based PCB inspection methods rely only on the inspected PCB image for defect detection, ignoring the defect-free reference image that encodes the expected layout of traces, pads, and other PCB structures. In this work, we propose RefDiffNet, a lightweight plug-and-play input enhancement block placed before the detector backbone to enhance the image before defect detection. RefDiffNet brings one proven idea from classical inspection into the deep learning era, using a defect-free reference image to reveal defects. RefDiffNet compares the defective image with the aligned reference, captures structural changes relative to the reference, and uses a lightweight encoder to output the original image with defective regions highlighted, thereby making the downstream detector's task easier. Results on HRIPCB and DeepPCB show that RefDiffNet consistently improves performance across detector families, including one-stage detectors from YOLOv8 to YOLOv26, the transformer-based RT-DETR, and the two-stage Faster R-CNN. It achieves up to 18% relative mAP50:95 gain with negligible overhead, introducing only 0.004 - 0.005M additional parameters and 0.7 - 0.8 GFLOPs, amounting to at most 0.25% of the parameter count of any evaluated detector. Results establish RefDiffNet as a lightweight, plug-and-play, detector-agnostic input enhancement module that substantially improves PCB defect detection with minimal computational cost.