Rebecca Chen

Euclid Collaboration, X. Xu, R. Chen et al.

We present an end-to-end, iterative pipeline for efficient identification of strong galaxy--galaxy lensing systems, applied to the Euclid Q1 imaging data. Starting from VIS catalogues, we reject point sources, apply a magnitude cut (I$_E$ $\leq$ 24) on deflectors, and run a pixel-level artefact/noise filter to build 96 $\times$ 96 pix cutouts; VIS+NISP colour composites are constructed with a VIS-anchored luminance scheme that preserves VIS morphology and NISP colour contrast. A VIS-only seed classifier supplies clear positives and typical impostors, from which we curate a morphology-balanced negative set and augment scarce positives. Among the six CNNs studied initially, a modified VGG16 (GlobalAveragePooling + 256/128 dense layers with the last nine layers trainable) performs best; the training set grows from 27 seed lenses (augmented to 1809) plus 2000 negatives to a colour dataset of 30,686 images. After three rounds of iterative fine-tuning, human grading of the top 4000 candidates ranked by the final model yields 441 Grade A/B candidate lensing systems, including 311 overlapping with the existing Q1 strong-lens catalogue, and 130 additional A/B candidates (9 As and 121 Bs) not previously reported. Independently, the model recovers 740 out of 905 (81.8%) candidate Q1 lenses within its top 20,000 predictions, considering off-centred samples. Candidates span I$_E$ $\simeq$ 17--24 AB mag (median 21.3 AB mag) and are redder in Y$_E$--H$_E$ than the parent population, consistent with massive early-type deflectors. Each training iteration required a week for a small team, and the approach easily scales to future Euclid releases; future work will calibrate the selection function via lens injection, extend recall through uncertainty-aware active learning, explore multi-scale or attention-based neural networks with fast post-hoc vetters that incorporate lens models into the classification.

Yuxuan Yin, Xiaoxiao Wang, Rebecca Chen et al.

Predicting the minimum operating voltage ($V_{min}$) of chips is one of the important techniques for improving the manufacturing testing flow, as well as ensuring the long-term reliability and safety of in-field systems. Current $V_{min}$ prediction methods often provide only point estimates, necessitating additional techniques for constructing prediction confidence intervals to cover uncertainties caused by different sources of variations. While some existing techniques offer region predictions, but they rely on certain distributional assumptions and/or provide no coverage guarantees. In response to these limitations, we propose a novel distribution-free $V_{min}$ interval estimation methodology possessing a theoretical guarantee of coverage. Our approach leverages conformalized quantile regression and on-chip monitors to generate reliable prediction intervals. We demonstrate the effectiveness of the proposed method on an industrial 5nm automotive chip dataset. Moreover, we show that the use of on-chip monitors can reduce the interval length significantly for $V_{min}$ prediction.

Yuxuan Yin, Rebecca Chen, Boxun Xu et al.

Accurate prediction of chip performance is critical for ensuring energy efficiency and reliability in semiconductor manufacturing. However, developing minimum operating voltage ($V_{min}$) prediction models at advanced technology nodes is challenging due to limited training data and the complex relationship between process variations and $V_{min}$. To address these issues, we propose a novel transfer learning framework that leverages abundant legacy data from the 16nm technology node to enable accurate $V_{min}$ prediction at the advanced 5nm node. A key innovation of our approach is the integration of input features derived from on-chip silicon odometer sensor data, which provide fine-grained characterization of localized process variations -- an essential factor at the 5nm node -- resulting in significantly improved prediction accuracy.