Wei Sun

2papers

2 Papers

7.3IVJul 6Code
CompressedVQA-AEV: Full-Reference and No-Reference Quality Assessment Models for Asymmetric Encoded Videos

Wei Sun, Xingwei Liu, Dandan Zhu et al.

This report presents our solutions to the QoMEX 2026 Grand Challenge on Video Quality Assessment for Asymmetric Encoded Videos, comprising a full-reference (FR) model, CompressedVQA-AEV-FR, and a no-reference (NR) model, CompressedVQA-AEV-NR. The FR approach leverages a Swin-B backbone to extract multi-stage similarity statistics between reference and distorted videos for quality prediction. For the NR setting, our model employs complementary frame-level encoders based on SigLIP2 and Swin-B, followed by temporal mean pooling and cross-fold ensembling to estimate perceptual quality without reference data. Our CompressedVQA-AEV-FR achieves first place in the FR track of QoMEX 2026 Grand Challenge, while CompressedVQA-AEV-NR secures fourth place in the NR track, demonstrating the effectiveness of our proposed models. The code is available at https://github.com/sunwei925/CompressedVQA-AEV.

5.8CVJul 6
ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing

Wei Sun, Weixia Zhang, Linhan Cao et al.

This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization. To address these limitations, we design two complementary tracks: Track 1 (Cross-Scenario Defect Detection) targets accurate defect detection, localization, and classification across diverse unseen production environments; Track 2 (Fine-Grained Severity Grading) requires assigning each detected defect an industry-standard severity level, including Acceptable, Marginal NG, NG, and Gross NG. We construct a large-scale industrial dataset of high-resolution microscopic images spanning seven representative defect categories, comprising over 3,800 images with pixel-level instance annotations for Track 1 and over 2,600 images with severity-grade labels for Track 2. The challenge attracted 86 registered participants with 130 submissions; during the final testing phase, 21 teams submitted results and 12 teams provided models with technical reports. The resulting benchmark, together with the diverse and effective solutions contributed by participating teams, sets a new standard for industrial defect analysis research.