Juyeon Yoon

Gabin An, Juyeon Yoon, Shin Yoo

Defects4J has enabled numerous software testing and debugging research work since its introduction. A large part of its contribution, and the resulting popularity, lies in the clear separation and distillation of the root cause of each individual test failure based on careful manual analysis, which in turn allowed researchers to easily study individual faults in isolation. However, in a realistic debugging scenario, multiple faults can coexist and affect test results collectively. Study of automated debugging techniques for these situations, such as failure clustering or fault localisation for multiple faults, would significantly benefit from a reliable benchmark of multiple, coexisting faults. We search for versions of Defects4J subjects that contain multiple faults, by iteratively transplanting fault-revealing test cases across Defects4J versions. Out of 326 studied versions of Defects4J subjects, we report that over 95% (311 versions) actually contain from two to 24 faults. We hope that the extended, multi-fault Defects4J can provide a platform for future research of testing and debugging techniques for multi-fault programs.

Gabin An, Juyeon Yoon, Joyce Jiyoung Whang et al.

Automated debugging techniques, such as Fault Localisation (FL) or Automated Program Repair (APR), are typically designed under the Single Fault Assumption (SFA). However, in practice, an unknown number of faults can independently cause multiple test case failures, making it difficult to allocate resources for debugging and to use automated debugging techniques. Clustering algorithms have been applied to group the test failures according to their root causes, but their accuracy can often be lacking due to the inherent limits in the distance metrics for test cases. We introduce a new test distance metric based on hypergraphs and evaluate their accuracy using multi-fault benchmarks that we have built on top of Defects4J and SIR. Results show that our technique, Hybiscus, can automatically achieve perfect clustering (i.e., the same number of clusters as the ground truth number of root causes, with all failing tests with the same root cause grouped together) for 418 out of 605 test runs with multiple test failures. Better failure clustering also allows us to separate different root causes and apply FL techniques under SFA, resulting in saving up to 82% of the total wasted effort when compared to the state-of-the-art technique for multiple fault localisation.