Oliver Gordon

Steff Farley, Jo E. A. Hodgkinson, Oliver M. Gordon et al.

A wide range of techniques can be considered for segmentation of images of nanostructured surfaces. Manually segmenting these images is time-consuming and results in a user-dependent segmentation bias, while there is currently no consensus on the best automated segmentation methods for particular techniques, image classes, and samples. Any image segmentation approach must minimise the noise in the images to ensure accurate and meaningful statistical analysis can be carried out. Here we develop protocols for the segmentation of images of 2D assemblies of gold nanoparticles formed on silicon surfaces via deposition from an organic solvent. The evaporation of the solvent drives far-from-equilibrium self-organisation of the particles, producing a wide variety of nano- and micro-structured patterns. We show that a segmentation strategy using the U-Net convolutional neural network outperforms traditional automated approaches and has particular potential in the processing of images of nanostructured systems.

O. Gordon, F. Junqueira, P. Moriarty

Scanning probe microscopists generally do not rely on complete images to assess the quality of data acquired during a scan. Instead, assessments of the state of the tip apex, which not only determines the resolution in any scanning probe technique but can also generate a wide array of frustrating artefacts, are carried out in real time on the basis of a few lines of an image (and, typically, their associated line profiles.) The very small number of machine learning approaches to probe microscopy published to date, however, involve classifications based on full images. Given that data acquisition is the most time-consuming task during routine tip conditioning, automated methods are thus currently extremely slow in comparison to the tried-and-trusted strategies and heuristics used routinely by probe microscopists. Here, we explore various strategies by which different STM image classes (arising from changes in the tip state) can be correctly identified from partial scans. By employing a secondary temporal network and a rolling window of a small group of individual scanlines, we find that tip assessment is possible with a small fraction of a complete image. We achieve this with little-to-no performance penalty -- or, indeed, markedly improved performance in some cases -- and introduce a protocol to detect the state of the tip apex in real time.