James T. Meech

James T. Meech · cambridge

We present a new high-level synthesis methodology for using large language model tools to generate hardware designs. The methodology uses exclusively open-source tools excluding the large language model. As a case study, we use our methodology to generate a permuted congruential random number generator design with a wishbone interface. We verify the functionality and quality of the random number generator design using large language model-generated simulations and the Dieharder randomness test suite. We document all the large language model chat logs, Python scripts, Verilog scripts, and simulation results used in the case study. We believe that our method of hardware design generation coupled with the open source silicon 130 nm design tools will revolutionize application-specific integrated circuit design. Our methodology significantly lowers the bar to entry when building domain-specific computing accelerators for the Internet of Things and proof of concept prototypes for later fabrication in more modern process nodes.

Thomas Newton, James T. Meech, Phillip Stanley-Marbell

Sensors with digital outputs require software conversion routines to transform the unitless analogue-to-digital converter samples to physical quantities with correct units. These conversion routines are computationally complex given the limited computational resources of low-power embedded systems. This article presents a set of machine learning methods to learn new, less-complex conversion routines that do not sacrifice accuracy for the BME680 environmental sensor. We present a Pareto analysis of the tradeoff between accuracy and computational overhead for the models and models that reduce the computational overhead of the existing industry-standard conversion routines for temperature, pressure, and humidity by 62%, 71 %, and 18 % respectively. The corresponding RMS errors are 0.0114 degrees C, 0.0280 KPa, and 0.0337 %. These results show that machine learning methods for learning conversion routines can produce conversion routines with reduced computational overhead which maintain good accuracy.

Nathaniel Joseph Tye, James Timothy Meech, Bilgesu Arif Bilgin et al.

We introduce a new method for hardware non-uniform random number generation based on the transfer characteristics of graphene field-effect transistors (GFETs) which requires as few as two transistors and a resistor (or transimpedance amplifier). The method could be integrated into a custom computing system to provide samples from arbitrary univariate distributions. We also demonstrate the use of wavelet decomposition of the target distribution to determine GFET bias voltages in a multi-GFET array. We implement the method by fabricating multiple GFETs and experimentally validating that their transfer characteristics exhibit the nonlinearity on which our method depends. We use the characterization data in simulations of a proposed architecture for generating samples from dynamically-selectable non-uniform probability distributions. Using a combination of experimental measurements of GFETs under a range of biasing conditions and simulation of the GFET-based non-uniform random variate generator architecture, we demonstrate a speedup of Monte Carlo integration by a factor of up to 2$\times$. This speedup assumes the analog-to-digital converters reading the outputs from the circuit can produce samples in the same amount of time that it takes to perform memory accesses.

James Timothy Meech, Phillip Stanley-Marbell

We introduce a method for non-uniform random number generation based on sampling a physical process in a controlled environment. We demonstrate one proof-of-concept implementation of the method that reduces the error of Monte Carlo integration of a univariate Gaussian by 1068 times while doubling the speed of the Monte Carlo simulation. We show that the supply voltage and temperature of the physical process must be controlled to prevent the mean and standard deviation of the random number generator from drifting.