Shihan Chen

h-index9
2papers
318citations

2 Papers

5.1GRJun 21, 2025Code
3D Gaussian Splatting for Fine-Detailed Surface Reconstruction in Large-Scale Scene

Shihan Chen, Zhaojin Li, Zeyu Chen et al.

Recent developments in 3D Gaussian Splatting have made significant advances in surface reconstruction. However, scaling these methods to large-scale scenes remains challenging due to high computational demands and the complex dynamic appearances typical of outdoor environments. These challenges hinder the application in aerial surveying and autonomous driving. This paper proposes a novel solution to reconstruct large-scale surfaces with fine details, supervised by full-sized images. Firstly, we introduce a coarse-to-fine strategy to reconstruct a coarse model efficiently, followed by adaptive scene partitioning and sub-scene refining from image segments. Additionally, we integrate a decoupling appearance model to capture global appearance variations and a transient mask model to mitigate interference from moving objects. Finally, we expand the multi-view constraint and introduce a single-view regularization for texture-less areas. Our experiments were conducted on the publicly available dataset GauU-Scene V2, which was captured using unmanned aerial vehicles. To the best of our knowledge, our method outperforms existing NeRF-based and Gaussian-based methods, achieving high-fidelity visual results and accurate surface from full-size image optimization. Open-source code will be available on GitHub.

3.6CVJul 8, 2025Code
Semi-Supervised Defect Detection via Conditional Diffusion and CLIP-Guided Noise Filtering

Shuai Li, Shihan Chen, Wanru Geng et al.

In the realm of industrial quality inspection, defect detection stands as a critical component, particularly in high-precision, safety-critical sectors such as automotive components aerospace, and medical devices. Traditional methods, reliant on manual inspection or early image processing algorithms, suffer from inefficiencies, high costs, and limited robustness. This paper introduces a semi-supervised defect detection framework based on conditional diffusion (DSYM), leveraging a two-stage collaborative training mechanism and a staged joint optimization strategy. The framework utilizes labeled data for initial training and subsequently incorporates unlabeled data through the generation of pseudo-labels. A conditional diffusion model synthesizes multi-scale pseudo-defect samples, while a CLIP cross-modal feature-based noise filtering mechanism mitigates label contamination. Experimental results on the NEU-DET dataset demonstrate a 78.4% mAP@0.5 with the same amount of labeled data as traditional supervised methods, and 75.1% mAP@0.5 with only 40% of the labeled data required by the original supervised model, showcasing significant advantages in data efficiency. This research provides a high-precision, low-labeling-dependent solution for defect detection in industrial quality inspection scenarios. The work of this article has been open-sourced at https://github.com/cLin-c/Semisupervised-DSYM.