Christopher Bennett

Ethan Ancell, Christopher Bennett, Bert Debusschere et al.

Neural networks have revolutionized the field of machine learning with increased predictive capability. In addition to improving the predictions of neural networks, there is a simultaneous demand for reliable uncertainty quantification on estimates made by machine learning methods such as neural networks. Bayesian neural networks (BNNs) are an important type of neural network with built-in capability for quantifying uncertainty. This paper discusses aleatoric and epistemic uncertainty in BNNs and how they can be calculated. With an example dataset of images where the goal is to identify the amplitude of an event in the image, it is shown that epistemic uncertainty tends to be lower in images which are well-represented in the training dataset and tends to be high in images which are not well-represented. An algorithm for out-of-distribution (OoD) detection with BNN epistemic uncertainty is introduced along with various experiments demonstrating factors influencing the OoD detection capability in a BNN. The OoD detection capability with epistemic uncertainty is shown to be comparable to the OoD detection in the discriminator network of a generative adversarial network (GAN) with comparable network architecture.

Christopher Bennett, Kerstin Eder

Microelectronic design verification remains a critical bottleneck in device development, traditionally mitigated by expanding verification teams and computational resources. Since the late 1990s, machine learning (ML) has been proposed to enhance verification efficiency, yet many techniques have not achieved mainstream adoption. This review, from the perspective of verification and ML practitioners, examines the application of ML in dynamic-based techniques for functional verification of microelectronic designs, and provides a starting point for those new to this interdisciplinary field. Historical trends, techniques, ML types, and evaluation baselines are analysed to understand why previous research has not been widely adopted in industry. The review highlights the application of ML, the techniques used and critically discusses their limitations and successes. Although there is a wealth of promising research, real-world adoption is hindered by challenges in comparing techniques, identifying suitable applications, and the expertise required for implementation. This review proposes that the field can progress through the creation and use of open datasets, common benchmarks, and verification targets. By establishing open evaluation criteria, industry can guide future research. Parallels with ML in software verification suggest potential for collaboration. Additionally, greater use of open-source designs and verification environments can allow more researchers from outside the hardware verification discipline to contribute to the challenge of verifying microelectronic designs.

Ravi G. Patel, T. Patrick Xiao, Sapan Agarwal et al.

Recent work has demonstrated that Bayesian neural networks (BNN's) trained with mean field variational inference (MFVI) can be implemented in analog hardware, promising orders of magnitude energy savings compared to the standard digital implementations. However, while Gaussians are typically used as the variational distribution in MFVI, it is difficult to precisely control the shape of the noise distributions produced by sampling analog devices. This paper introduces a method for MFVI training using real device noise as the variational distribution. Furthermore, we demonstrate empirically that the predictive distributions from BNN's with the same weight means and variances converge to the same distribution, regardless of the shape of the variational distribution. This result suggests that analog device designers do not need to consider the shape of the device noise distribution when hardware-implementing BNNs performing MFVI.