7.2HCMar 1, 2025
A Review of Brain-Computer Interface Technologies: Signal Acquisition Methods and Interaction ParadigmsYifan Wang, Cheng Jiang, Chenzhong Li
Brain-Computer Interface (BCI) technology facilitates direct communication between the human brain and external devices, representing a substantial advancement in human-machine interaction. This review provides an in-depth analysis of various BCI paradigms, including classic paradigms, current classifications, and hybrid paradigms, each with distinct characteristics and applications. Additionally, we explore a range of signal acquisition methods, classified into non-implantation, intervention, and implantation techniques, elaborating on their principles and recent advancements. By examining the interdependence between paradigms and signal acquisition technologies, this review offers a comprehensive perspective on how innovations in one domain propel progress in the other. The goal is to present insights into the future development of more efficient, user-friendly, and versatile BCI systems, emphasizing the synergy between paradigm design and signal acquisition techniques and their potential to transform the field.
10.2CVJul 15, 2025
A Comprehensive Survey for Real-World Industrial Defect Detection: Challenges, Approaches, and ProspectsYuqi Cheng, Yunkang Cao, Haiming Yao et al.
Industrial defect detection is vital for upholding product quality across contemporary manufacturing systems. As the expectations for precision, automation, and scalability intensify, conventional inspection approaches are increasingly found wanting in addressing real-world demands. Notable progress in computer vision and deep learning has substantially bolstered defect detection capabilities across both 2D and 3D modalities. A significant development has been the pivot from closed-set to open-set defect detection frameworks, which diminishes the necessity for extensive defect annotations and facilitates the recognition of novel anomalies. Despite such strides, a cohesive and contemporary understanding of industrial defect detection remains elusive. Consequently, this survey delivers an in-depth analysis of both closed-set and open-set defect detection strategies within 2D and 3D modalities, charting their evolution in recent years and underscoring the rising prominence of open-set techniques. We distill critical challenges inherent in practical detection environments and illuminate emerging trends, thereby providing a current and comprehensive vista of this swiftly progressing field.