MTRL-SCIFeb 11, 2025
PICTS: A Novel Deep Reinforcement Learning Approach for Dynamic P-I Control in Scanning Probe MicroscopyZiwei Wei, Shuming Wei, Qibin Zeng et al.
We have developed a Parallel Integrated Control and Training System, leveraging the deep reinforcement learning to dynamically adjust the control strategies in real time for scanning probe microscopy techniques.