Yu Gu

Xin Ai, Qiange Wang, Chunyu Cao et al.

Graph Neural Networks (GNNs) have demonstrated outstanding performance in various applications. Existing frameworks utilize CPU-GPU heterogeneous environments to train GNN models and integrate mini-batch and sampling techniques to overcome the GPU memory limitation. In CPU-GPU heterogeneous environments, we can divide sample-based GNN training into three steps: sample, gather, and train. Existing GNN systems use different task orchestrating methods to employ each step on CPU or GPU. After extensive experiments and analysis, we find that existing task orchestrating methods fail to fully utilize the heterogeneous resources, limited by inefficient CPU processing or GPU resource contention. In this paper, we propose NeutronOrch, a system for sample-based GNN training that incorporates a layer-based task orchestrating method and ensures balanced utilization of the CPU and GPU. NeutronOrch decouples the training process by layer and pushes down the training task of the bottom layer to the CPU. This significantly reduces the computational load and memory footprint of GPU training. To avoid inefficient CPU processing, NeutronOrch only offloads the training of frequently accessed vertices to the CPU and lets GPU reuse their embeddings with bounded staleness. Furthermore, NeutronOrch provides a fine-grained pipeline design for the layer-based task orchestrating method, fully overlapping different tasks on heterogeneous resources while strictly guaranteeing bounded staleness. The experimental results show that compared with the state-of-the-art GNN systems, NeutronOrch can achieve up to 11.51x performance speedup.

Xiaolin Yan, Yangxing Liu, Jiazhang Zheng et al.

Large language models (LLMs) have recently achieved significant advances in reasoning and demonstrated their advantages in solving challenging problems. Yet, their effectiveness in the semiconductor display industry remains limited due to a lack of domain-specific training and expertise. To bridge this gap, we present X-Intelligence 3.0, the first high-performance reasoning model specifically developed for the semiconductor display industry. This model is designed to deliver expert-level understanding and reasoning for the industry's complex challenges. Leveraging a carefully curated industry knowledge base, the model undergoes supervised fine-tuning and reinforcement learning to enhance its reasoning and comprehension capabilities. To further accelerate development, we implemented an automated evaluation framework that simulates expert-level assessments. We also integrated a domain-specific retrieval-augmented generation (RAG) mechanism, resulting in notable performance gains on benchmark datasets. Despite its relatively compact size of 32 billion parameters, X-Intelligence 3.0 outperforms SOTA DeepSeek-R1-671B across multiple evaluations. This demonstrates its exceptional efficiency and establishes it as a powerful solution to the longstanding reasoning challenges faced by the semiconductor display industry.

Wenjian Yu, Yu Gu, Jian Li et al.

Principal component analysis (PCA) is a fundamental dimension reduction tool in statistics and machine learning. For large and high-dimensional data, computing the PCA (i.e., the singular vectors corresponding to a number of dominant singular values of the data matrix) becomes a challenging task. In this work, a single-pass randomized algorithm is proposed to compute PCA with only one pass over the data. It is suitable for processing extremely large and high-dimensional data stored in slow memory (hard disk) or the data generated in a streaming fashion. Experiments with synthetic and real data validate the algorithm's accuracy, which has orders of magnitude smaller error than an existing single-pass algorithm. For a set of high-dimensional data stored as a 150 GB file, the proposed algorithm is able to compute the first 50 principal components in just 24 minutes on a typical 24-core computer, with less than 1 GB memory cost.