Inez Zwetsloot

Jiaqi Qiu, Yu Lin, Inez Zwetsloot

The recurrent neural network and its variants have shown great success in processing sequences in recent years. However, this deep neural network has not aroused much attention in anomaly detection through predictively process monitoring. Furthermore, the traditional statistic models work on assumptions and hypothesis tests, while neural network (NN) models do not need that many assumptions. This flexibility enables NN models to work efficiently on data with time-varying variability, a common inherent aspect of data in practice. This paper explores the ability of the recurrent neural network structure to monitor processes and proposes a control chart based on long short-term memory (LSTM) prediction intervals for data with time-varying variability. The simulation studies provide empirical evidence that the proposed model outperforms other NN-based predictive monitoring methods for mean shift detection. The proposed method is also applied to time series sensor data, which confirms that the proposed method is an effective technique for detecting abnormalities.

Fadel M. Megahed, Ying-Ju Chen, Bianca Maria Colosimo et al.

This expository paper introduces a simplified approach to image-based quality inspection in manufacturing using OpenAI's CLIP (Contrastive Language-Image Pretraining) model adapted for few-shot learning. While CLIP has demonstrated impressive capabilities in general computer vision tasks, its direct application to manufacturing inspection presents challenges due to the domain gap between its training data and industrial applications. We evaluate CLIP's effectiveness through five case studies: metallic pan surface inspection, 3D printing extrusion profile analysis, stochastic textured surface evaluation, automotive assembly inspection, and microstructure image classification. Our results show that CLIP can achieve high classification accuracy with relatively small learning sets (50-100 examples per class) for single-component and texture-based applications. However, the performance degrades with complex multi-component scenes. We provide a practical implementation framework that enables quality engineers to quickly assess CLIP's suitability for their specific applications before pursuing more complex solutions. This work establishes CLIP-based few-shot learning as an effective baseline approach that balances implementation simplicity with robust performance, demonstrated in several manufacturing quality control applications.