J. S. van Hulst

J. S. van Hulst, W. P. M. H. Heemels, D. J. Antunes

Reinforcement learning (RL) is a powerful framework for decision-making in uncertain environments, but it often requires large amounts of data to learn an optimal policy. We address this challenge by incorporating prior model knowledge to guide exploration and accelerate the learning process. Specifically, we assume access to a model set that contains the true transition kernel and reward function. We optimize over this model set to obtain upper and lower bounds on the Q-function, which are then used to guide the exploration of the agent. We provide theoretical guarantees on the convergence of the Q-function to the optimal Q-function under the proposed class of exploring policies. Furthermore, we also introduce a data-driven regularized version of the model set optimization problem that ensures the convergence of the class of exploring policies to the optimal policy. Lastly, we show that when the model set has a specific structure, namely the bounded-parameter MDP (BMDP) framework, the regularized model set optimization problem becomes convex and simple to implement. In this setting, we also prove finite-time convergence to the optimal policy under mild assumptions. We demonstrate the effectiveness of the proposed exploration strategy, which we call BUMEX (Bounded Uncertainty Model-based Exploration), in a simulation study. The results indicate that the proposed method can significantly accelerate learning in benchmark examples. A toolbox is available at https://github.com/JvHulst/BUMEX.

Jilles S. van Hulst, W. P. M. H., Heemels et al.

Electron microscopy has enabled many scientific breakthroughs across multiple fields. A key challenge is the tuning of microscope parameters based on images to overcome optical aberrations that deteriorate image quality. This calibration problem is challenging due to the high-dimensional and noisy nature of the diagnostic images, and the fact that optimal parameters cannot be identified from a single image. We tackle the calibration problem for Scanning Transmission Electron Microscopes (STEM) by employing variational autoencoders (VAEs), trained on simulated data, to learn low-dimensional representations of images, whereas most existing methods extract only scalar values. We then simultaneously estimate the model that maps calibration parameters to encoded representations and the optimal calibration parameters using an expectation maximization (EM) approach. This joint estimation explicitly addresses the simulation-to-reality gap inherent in data-driven methods that train on simulated data from a digital twin. We leverage the known symmetry property of the optical system to establish global identifiability of the joint estimation problem, ensuring that a unique optimum exists. We demonstrate that our approach is substantially faster and more consistent than existing methods on a real STEM, achieving a 2x reduction in estimation error while requiring fewer observations. This represents a notable advance in automated STEM calibration and demonstrates the potential of VAEs for information compression in images. Beyond microscopy, the VAE-EM framework applies to inverse problems where simulated training data introduces a reality gap and where non-injective mappings would otherwise prevent unique solutions.