A. Hammad

h-index3
2papers

2 Papers

HEP-PHJul 20, 2022
Exploration of Parameter Spaces Assisted by Machine Learning

A. Hammad, Myeonghun Park, Raymundo Ramos et al.

We demonstrate two sampling procedures assisted by machine learning models via regression and classification. The main objective is the use of a neural network to suggest points likely inside regions of interest, reducing the number of evaluations of time consuming calculations. We compare results from this approach with results from other sampling methods, namely Markov chain Monte Carlo and MultiNest, obtaining results that range from comparably similar to arguably better. In particular, we augment our classifier method with a boosting technique that rapidly increases the efficiency within a few iterations. We show results from our methods applied to a toy model and the type II 2HDM, using 3 and 7 free parameters, respectively. The code used for this paper and instructions are publicly available on the web.

HEP-PHDec 27, 2024
DLScanner: A parameter space scanner package assisted by deep learning methods

A. Hammad, Raymundo Ramos

In this paper, we introduce a scanner package enhanced by deep learning (DL) techniques. The proposed package addresses two significant challenges associated with previously developed DL-based methods: slow convergence in high-dimensional scans and the limited generalization of the DL network when mapping random points to the target space. To tackle the first issue, we utilize a similarity learning network that maps sampled points into a representation space. In this space, in-target points are grouped together while out-target points are effectively pushed apart. This approach enhances the scan convergence by refining the representation of sampled points. The second challenge is mitigated by integrating a dynamic sampling strategy. Specifically, we employ a VEGAS mapping to adaptively suggest new points for the DL network while also improving the mapping when more points are collected. Our proposed framework demonstrates substantial gains in both performance and efficiency compared to other scanning methods.